메뉴 건너뛰기




Volumn 258, Issue 7, 2012, Pages 2620-2626

Study on the nano machining process with a vibrating AFM tip on the polymer surface

Author keywords

AFM; Dynamic ploughing; Nanomachining; Polymer; Tapping mode

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; MACHINING; MACHINING CENTERS; POLYMERS; TAPS;

EID: 84855552852     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.10.107     Document Type: Article
Times cited : (15)

References (20)
  • 1
    • 0029639813 scopus 로고
    • Device fabrication by scanned probe oxidation
    • J.A. Dagata Device fabrication by scanned probe oxidation Science 270 5242 1995 1625 1626 (Pubitemid 126635468)
    • (1995) Science , vol.270 , Issue.5242 , pp. 1625-1626
    • Dagata, J.A.1
  • 2
    • 77952678624 scopus 로고    scopus 로고
    • Matrix-assisted dip-pen nanolithography and polymer pen lithography
    • L. Huang, A.B. Braunschweig, and W. Shim Matrix-assisted dip-pen nanolithography and polymer pen lithography Small 6 10 2010 1077 1081
    • (2010) Small , vol.6 , Issue.10 , pp. 1077-1081
    • Huang, L.1    Braunschweig, A.B.2    Shim, W.3
  • 3
    • 67650149416 scopus 로고    scopus 로고
    • Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes
    • E. Gnecco, E. Riedo, and W.P. King Linear ripples and traveling circular ripples produced on polymers by thermal AFM probes Physical Review B 79 23 2009 235421
    • (2009) Physical Review B , vol.79 , Issue.23 , pp. 235421
    • Gnecco, E.1    Riedo, E.2    King, W.P.3
  • 5
    • 58149235571 scopus 로고    scopus 로고
    • Nanoscale lithography with frequency-modulation atomic force microscopy
    • M. Hamada, T. Eguchi, and K. Akiyama Nanoscale lithography with frequency-modulation atomic force microscopy Review of Scientific Instruments 79 12 2008 123706
    • (2008) Review of Scientific Instruments , vol.79 , Issue.12 , pp. 123706
    • Hamada, M.1    Eguchi, T.2    Akiyama, K.3
  • 6
    • 34247377811 scopus 로고    scopus 로고
    • Investigation on AFM-based micro/nano-CNC machining system
    • DOI 10.1016/j.ijmachtools.2007.01.008, PII S0890695507000314
    • Y.D. Yan, T. Sun, and Y.C. Liang Investigation on AFM-based micro/nano-CNC machining system International Journal of Machine Tools & Manufacture 47 11 2007 1651 1659 (Pubitemid 46634976)
    • (2007) International Journal of Machine Tools and Manufacture , vol.47 , Issue.11 , pp. 1651-1659
    • Yan, Y.1    Sun, T.2    Liang, Y.3    Dong, S.4
  • 7
    • 77950217699 scopus 로고    scopus 로고
    • Top-down nanomechanical machining of three-dimensional nanostructures by atomic force microscopy
    • Y.D. Yan, Hu Zhenjiang, and X.S. Zhao Top-down nanomechanical machining of three-dimensional nanostructures by atomic force microscopy Small 6 6 2010 724 728
    • (2010) Small , vol.6 , Issue.6 , pp. 724-728
    • Yan, Y.D.1    Zhenjiang, H.2    Zhao, X.S.3
  • 8
    • 34547680048 scopus 로고    scopus 로고
    • Nanoscale patterning and deformation of soft matter by scanning probe microscopy
    • DOI 10.1016/j.msec.2006.08.004, PII S092849310600275X
    • S. Kassavetis, K. Mitsakakis, and S. Logothetidis Nanoscale patterning and deformation of soft matter by scanning probe microscopy Materials Science & Engineering C-Biomimetic and Supramolecular Systems 27 5-8 2007 1456 1460 (Pubitemid 47211837)
    • (2007) Materials Science and Engineering C , vol.27 , Issue.SPEC. ISS. , pp. 1456-1460
    • Kassavetis, S.1    Mitsakakis, K.2    Logothetidis, S.3
  • 9
    • 0041519261 scopus 로고    scopus 로고
    • Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope
    • DOI 10.1016/S0043-1648(03)00311-9
    • F. Iwata, M. Yamaguchi, and A. Sasaki Nanometer-scale layer modification of polycarbonate surface by scratching with tip oscillation using an atomic force microscope Wear 254 10 2003 1050 1055 (Pubitemid 37002433)
    • (2003) Wear , vol.254 , Issue.10 , pp. 1050-1055
    • Iwata, F.1    Yamaguchi, M.2    Sasaki, A.3
  • 10
    • 0037054121 scopus 로고    scopus 로고
    • Breaking polymer chains by dynamic plowing lithography
    • DOI 10.1016/S0032-3861(02)00285-9, PII S0032386102002859
    • B. Cappella, H. Sturm, and S.M. Weidner Breaking polymer chains by dynamic plowing lithography Polymer 43 16 2002 4461 4466 (Pubitemid 34624580)
    • (2002) Polymer , vol.43 , Issue.16 , pp. 4461-4466
    • Cappella, B.1    Sturm, H.2    Weidner, S.M.3
  • 11
    • 34249872694 scopus 로고    scopus 로고
    • Nanografting of alkanethiols by tapping mode atomic force microscopy
    • DOI 10.1021/la063385t
    • J. Liang, and G. Scoles Nanografting of alkanethiols by tapping mode atomic force microscopy Langmuir 23 11 2007 6142 6147 (Pubitemid 46868684)
    • (2007) Langmuir , vol.23 , Issue.11 , pp. 6142-6147
    • Liang, J.1    Scoles, G.2
  • 12
    • 0036139654 scopus 로고    scopus 로고
    • Comparison between dynamic plowing lithography and nanoindentation methods
    • B. Cappella, and H. Sturm Comparison between dynamic plowing lithography and nanoindentation methods Journal of Applied Physics 91 1 2002 506 512
    • (2002) Journal of Applied Physics , vol.91 , Issue.1 , pp. 506-512
    • Cappella, B.1    Sturm, H.2
  • 13
    • 3042568781 scopus 로고    scopus 로고
    • Direct measurement of tapping force with a cantilever deflection force sensor
    • DOI 10.1016/j.ultramic.2003.11.007, PII S030439910400035X
    • C.M. Su, L. Huang, and K. Kjoller Direct measurement of tapping force with a cantilever deflection force sensor Ultramicroscopy 100 3-4 2004 233 239 (Pubitemid 38834131)
    • (2004) Ultramicroscopy , vol.100 , Issue.3-4 , pp. 233-239
    • Su, C.1    Huang, L.2    Kjoller, K.3
  • 14
    • 3743070568 scopus 로고    scopus 로고
    • Deformation, contact time, and phase contrast in tapping mode scanning force microscopy
    • J. Tamayo, and R. Garcia Deformation: contact time, and phase contrast in tapping mode scanning force microscopy Langmuir 12 18 1996 4430 4435 (Pubitemid 126536460)
    • (1996) Langmuir , vol.12 , Issue.18 , pp. 4430-4435
    • Tamayo, J.1    Garcia, R.2
  • 15
    • 0000096909 scopus 로고    scopus 로고
    • Linearity of amplitude and phase in tapping-mode atomic force microscopy
    • M.V. Salapaka, D.J. Chen, and J.P. Cleveland Linearity of amplitude and phase in tapping-mode atomic force microscopy Physical Review B 61 2 2000 1106 1115
    • (2000) Physical Review B , vol.61 , Issue.2 , pp. 1106-1115
    • Salapaka, M.V.1    Chen, D.J.2    Cleveland, J.P.3
  • 16
    • 0028530375 scopus 로고
    • Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever
    • J. Chen, R.K. Workman, and D. Sarid Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever Nanotechnology 5 4 1994 199 204
    • (1994) Nanotechnology , vol.5 , Issue.4 , pp. 199-204
    • Chen, J.1    Workman, R.K.2    Sarid, D.3
  • 17
    • 77955555542 scopus 로고    scopus 로고
    • Linear and nonlinear approaches towards amplitude modulation atomic force microscopy
    • A. Delnavaz, S.N. Mahmoodi, and N. Jalili Linear and nonlinear approaches towards amplitude modulation atomic force microscopy Current Applied Physics 10 6 2010 1416 1421
    • (2010) Current Applied Physics , vol.10 , Issue.6 , pp. 1416-1421
    • Delnavaz, A.1    Mahmoodi, S.N.2    Jalili, N.3
  • 18
    • 0031332581 scopus 로고    scopus 로고
    • Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy
    • V.N. Koinkar, and B. Bhushan Scanning and transmission electron microcopies of single-crystal silicon microworn/machined using atomic force microscopy Journal of Materials Research 12 12 1997 3219 3224 (Pubitemid 127609082)
    • (1997) Journal of Materials Research , vol.12 , Issue.12 , pp. 3219-3224
    • Koinkar, V.N.1    Bhushan, B.2
  • 19
    • 2342533183 scopus 로고    scopus 로고
    • Exploring the consequences of attractive and repulsive regimes in tapping mode atomic force microscopy of DNA
    • Andres N. Round, and Mervyn J. Miles Exploring the consequences of attractive and repulsive regimes in tapping mode atomic force microscopy of DNA Nanotechnology 15 2004 S176 S183
    • (2004) Nanotechnology , vol.15
    • Round, A.N.1    Miles, M.J.2
  • 20
    • 0141453386 scopus 로고    scopus 로고
    • Andreas Stemmer tuning the interaction forces in tapping mode atomic force microscopy
    • Robert W. Stark, and Gerog Schitter Andreas Stemmer tuning the interaction forces in tapping mode atomic force microscopy Physics Review B 68 2003 085401
    • (2003) Physics Review B , vol.68 , pp. 085401
    • Stark, R.W.1    Schitter, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.