Scanning thermal microscopy

Topics in Applied Physics

Volumn 107, Issue , 2006, Pages 181-238

  Cretin, Bernard ^a   Gomès, Séverine ^b   Trannoy, Nathalie ^c   Vairac, Pascal ^a  

^a FEMTO ST INSTITUTE   (France)

^b UNIVERSITÉ DE LYON   (France)

^c EA 3802   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750809503     PISSN: 03034216     EISSN: 14370859     Source Type: Book Series    
DOI: 10.1007/11767862_9     Document Type: Article

References (111)

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