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Volumn 83, Issue 10, 2012, Pages

Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

Author keywords

[No Author keywords available]

Indexed keywords

ARBITRARY GEOMETRY; ARBITRARY SHAPE; ATOMIC FORCE MICROSCOPE CANTILEVERS; CALIBRATION METHOD; CONVERSION FACTOR; DESIGN AND APPLICATION; HYDRODYNAMIC FUNCTIONS; MICRO-CANTILEVERS; NANOMECHANICAL SYSTEMS; NON-IDEALITIES; QUALITY FACTORS; QUANTITATIVE MEASUREMENT; SMALL ASPECT RATIO; SPRING CONSTANTS; STATIC AND DYNAMIC; TRAPEZOIDAL CROSS SECTIONS; V-SHAPE;

EID: 84868360475     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4757398     Document Type: Conference Paper
Times cited : (253)

References (58)
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    • Doppler shift of the laser reflected from the cantilever causes beating in the interferometer signal, the frequency of which is directly proportional to the cantilever velocity; no additional calibration is necessary
    • Doppler shift of the laser reflected from the cantilever causes beating in the interferometer signal, the frequency of which is directly proportional to the cantilever velocity; no additional calibration is necessary.
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    • Power spectral density data were derived from the time series measurements using MATLAB code, Mathworks, Natick, MA
    • Power spectral density data were derived from the time series measurements using MATLAB code, Mathworks, Natick, MA.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.