Noncontact atomic force microscopy imaging of ferroelectric domains with functionalized tips

Applied Physics Letters

Volumn 98, Issue 16, 2011, Pages

  Nicklaus, Mischa ^a   Pignolet, Alain ^a   Harnagea, Catalin ^a   Ruediger, Andreas ^a  

^a INRS EMT   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC DATA STORAGE; FERROELECTRIC DOMAINS; FUNCTIONALIZED; HIGH RESOLUTION; HIGH-DENSITY; IMAGING METHOD; NONCONTACT ATOMIC FORCE MICROSCOPY; NUMERICAL SIMULATION; OUT-OF-PLANE; PROOF OF CONCEPT; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY; IMAGE QUALITY; IMAGING TECHNIQUES;

FERROELECTRICITY;

EID: 79955443504     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3579148     Document Type: Article

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