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Physical Review B - Condensed Matter and Materials Physics

Volumn 81, Issue 9, 2010, Pages

Impact of electrostatic forces in contact-mode scanning force microscopy

(3) Johann, F a,b Hoffmann, Á a Soergel, E a

a UNIVERSITY OF BONN (Germany)

b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954892591 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.81.094109 Document Type: Article

Times cited : (42)

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