Fast contact-mode atomic force microscopy on biological specimen by model-based control

Ultramicroscopy

Volumn 100, Issue 3-4, 2004, Pages 253-257

  Schitter, G ^a   Stark, R W ^a,b   Stemmer, A ^a  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF MUNICH   (Germany)

Author keywords

07.79. v; 07.79.Lh; 18,32; Atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTROL EQUIPMENT; DNA; IMAGING TECHNIQUES;

LIQUID ENVIRONMENT; PIEZOELECTRIC TUBE SCANNERS;

PIEZOELECTRIC DEVICES;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; LIQUID; MOLECULAR DYNAMICS; MOLECULAR MODEL; PIEZOELECTRICITY;

DNA, BACTERIAL; MICROSCOPY, ATOMIC FORCE; PLASMIDS;

EID: 3042609738     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.11.008     Document Type: Conference Paper

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