Direct measurement of the magnetic penetration depth by magnetic force microscopy

Superconductor Science and Technology

Volumn 25, Issue 11, 2012, Pages

  Kim, Jeehoon ^a   Civale, L ^a   Nazaretski, E ^b   Haberkorn, N ^a   Ronning, F ^a   Sefat, A S ^c   Tajima, T ^a   Moeckly, B H ^d   Thompson, J D ^a   Movshovich, R ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d SUPERCONDUCTOR TECHNOLOGIES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE VALUES; COMPARATIVE EXPERIMENTS; DIRECT MEASUREMENT; EXPERIMENTAL APPROACHES; MAGNETIC PENETRATION DEPTH; MODELING PROCEDURE; MULTIPLE SAMPLES; NB FILM; RESPONSE CURVES;

COBALT; MAGNETIC FORCE MICROSCOPY; SUPERCONDUCTING FILMS;

LOADING;

EID: 84867320253     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/25/11/112001     Document Type: Article

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