A review of atomic force microscopy imaging systems: Application to molecular metrology and biological sciences

Mechatronics

Volumn 14, Issue 8, 2004, Pages 907-945

  Jalili, Nader ^a   Laxminarayana, Karthik ^a  

^a AMRL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; ATOMIC FORCE MICROSCOPY; FEEDBACK; MICROSTRUCTURE; MOLECULAR BIOLOGY; NATURAL FREQUENCIES; PHOTODETECTORS; PIEZOELECTRIC DEVICES;

ATOMIC FORCES; MICRO-CANTILEVER SYSTEMS; MOLECULAR METROLOGY;

IMAGING SYSTEMS;

EID: 3142766062     PISSN: 09574158     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mechatronics.2004.04.005     Document Type: Article

References (124)

1. Albrecht T.R., Grutter P., Horne D., Rugar D. Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. J. Appl. Phys. 69:1991;668.
2. Allan B.W., Garcia R., Maegley K., Mort J., Wong D., Lindstrom W., et al. DNA bending by EcoRI DNA methyltransferase accelerates base flipping but compromises specificity. J. Biol. Chem. 274:1999;19269-19275.
3. Amelio S., Goldade A.V., Rabe U., Scherer V., Bhushan B., Arnold W. Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy. Thin Solid Films. 392(1):2001;75-84.
4. Anczykowski B., Cleveland J.P., Kruger D., Elings V.B., Fuchs H. Analysis of the interactionmechanisms in dynamicmode SFM by means of experimental data and computer simulation. Appl. Phys. A. 66(7):1998;S885.
5. Anczykowski B., Gotsmann B., Fuchs H., Cleveland J.P., Elings V.B. How to measure energy dissipation in dynamic mode atomic force microscopy. Appl. Surf. Sci. 140:1999;376-382.
6. Anczykowski B., Krüger D., Fuchs H. Cantilever dynamics in quasi non-contact force microscopy: spectroscopic aspects. Phys. Rev. B. 53:1996;15485-15488.
7. Anczykowski B., Kruger D., Babcock K.L., Fuchs H. Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation. Ultramicroscopy. 66:1996;251-259.
8. Argaman M., Golan R., Thomson N.H., Hansma H.G. Phase imaging of moving DNA molecules and DNA molecules replicated in the atomic force microscope. Nucl. Acids Res. 25:1997;4379-4384.
9. Ashhab M., Salapaka M.V., Dahleh M., Mezic I. Dynamical analysis and control of microcantilevers. Automatica. 35(10):1999;1663-1670.
10. Ashhab M., Salapaka M.V., Dahleh M., Mezic I. Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy. Nonlinear Dyn. 20(3):1999;197-220.
11. Banks H.T., Inman D.J. On damping mechanisms in beams. ASME J. Appl. Mech. 58:1991;716-723.
12. Basso M, Giarre L, Dahleh M, Mezic I. Numerical analysis of complex dynamics in atomic force microscopes. Proc IEEE Conf Control Appl. Trieste, Italy, September 1998, pp. 1026-1030.
13. Berg O.G., Winter R.B., von Hippel P.H. Diffusion-driven mechanisms of protein translocation on nucleic acids. 1. Models and theory. Biochemistry. 20:1981;6929-6948.
14. Bezanilla M., Drake B., Nudler E., Kashlev M., Hansma P.K., Hansma H.G. Motion and enzymatic degradation of DNA in the atomic force microscope. Biophys. J. 67:1994;2454-2459.
15. Boland T., Ratner B.D. Direct measurement of hydrogen bonding in dna nucleotide bases by atomic force microscopy. Proc. Nat. Acad. Sci. USA. 92:1995;5297.
16. Braet F., Rotsch C., Wisse E., Radmacher M. Comparison of fixed and living liver endothelial cells by atomic force microscopy. Appl. Phys. A. 66(7):1997;S575-S578.
17. Burnham N.A., Colton R.J. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope. J. Vacuum Sci. Technol. A. 7:1989;2906.
18. Burnham N.A., Behrend O.P., Oulevey F., Gremaud G., Gallo P.J., Gourdon D., et al. How does a tip tap? Nanotechnology. 8(2):1997;67-75.
19. Camesano T.A., Wilkinson K.J. Single molecule study of xanthan conformation using atomic force microscopy. Biomacromolecules. 2:2001;1184-1191.
20. Campbell P.M., Snow E.S., McMarr P.J. AFM-based fabrication of Si nanostructures. Phys. B: Condens. Matter. 227(1-4):1996;315-317.
21. Chen J., Workman R.K., Sarid D., Hooper R. Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever. Nanotechnology. 5:1994;199-204.
22. Chen X., McGurk S.L., Davies M.C., Roberts C.J., Shakesheff K.M., Tendler S.J.B., et al. Chemical and morphological analysis of surface enrichment in a biodegradable polymer blend by phase-detection imaging atomic force microscopy. Macromolecules. 31:1998;2278.
23. Clausen-Schaumann H., Seitz M., Krautbauer R., Gaub H.E. Force spectroscopy with single bio-molecules. Curr. Opin. Chem. Biol. 4:2000;524-530.
24. Colton R.J., Baselt D.R., Dufrene Y.F., Green J.B.D., Lee G.U. Scanning probe microscopy. Curr. Opin. Chem. Biol. 1:1997;370-377.
25. Dadfarnia M, Jalili N, Xian B, Dawson DM. A Lyapunov-based piezoelectric controller for flexible cartesian robot manipulators. ASME J Dyn Syst, Measurements and Control 2004;126:xx-xx+13.
26. Dagata J.A., Schneir J., Harary H.H., Evans C.J., Postek M.T., Bennett J. Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air. Appl. Phys. Lett. 56:1990;2001.
27. DeVecchio D., Bhushan B. Localized surface elasticity measurements using an atomic force microscope. Rev. Scientific Instrum. 68(12):1997;4498-4505.
28. Domke J., Parak W.J., George M., Gaub H.E., Radmacher M. Mapping the mechanical pulse of single cardiomyocytes with the atomic force microscope. European Biophys. J. 28(3):1999;179-186.
29. Dufrêne Y.F., Boland T., Schneider J.S., Barger W.R., Lee G.U. Characterization of the physical properties of model biomembranes at the nanometer scale with the atomic force microscope. Faraday Discuss. 111:1998;79-94.
30. Erie D.A., Yang G., Schultz H.C., Bustamante C. DNA bending by Cro protein in specific and nonspecific complexes: implications for protein site recognition and specificity. Science. 266:1994;1562-1566.
31. Fang Y, Dawson D, Feemster M, Jalili N. Active interaction force identification for atomic force microscope applications: lumped model. Proc 2002 Int Mech Eng Congr Exposition (IMECE'02). New Orleans, Louisiana (November 2002).
32. Fang Y, Feemster M, Dawson D, Jalili N. Active interaction force identification for atomic force microscope applications: PDE model. Proc 41st IEEE Conf Decision Control (CDC'02). Las Vegas, Nevada (December 2002).
33. Florin E.L., Moy V.T., Gaub H.E. Adhesive forces between individual ligand-receptor pairs. Science. 264:1994;415-417.
34. Fung R., Huang S. Dynamic modeling and vibration force microscope. ASME J. Vib. Acoust. 123:2001;502-509.
35. Gahlin R., Jacobson S. Novel method to map and quantify wear on a micro-scale. Wear. 222(2):1998;93-102.
36. Giessibl F.J. Atomic resolution of the Silicon (1. 1 1)-(7 × 7) surface by atomic force microscopy Science. 267(5194):1995;68.
37. Goeken M., Kempf M. Microstructural properties of superalloys investigated by nanoindentations in an atomic force microscope. Acta Mater. 47(3):1999;1043-1052.
38. Göken M., Vehoff H., Neumann P. Atomic force microscopy investigations of loaded crack tips in NiAl. J. Vacuum Sci. Technol. B. 14:1996;1157-1161.
39. Göken M., Vehoff H., Neumann P. Investigation of loaded crack tips in NiAl by atomic force microscopy. Scrip. Metall. Mater. 33:1995;1187-1192.
40. Goldhabergordon D., Montemerlo M.S., Love J.C., Opiteck G.J., Ellenbogen J.C. Overview of nanoelectronic devices. Proc. IEEE. 85:1997;521-540.
41. Güthner P. Simultaneous imaging of Si(1. 1 1) 7 × 7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy non-contact mode J. Vacuum Sci. Technol. B. 14:1996;2428.
42. Guthold M., Zhu X., Rivetti C., Yang G., Thomson N.H., Kasas S., et al. Direct observation of one-dimensional diffusion and transcription by escherichia coli RNA polymerase. Biophys. J. 77:1999;2284-2294.
43. Hafner J.H., Cheung C.L., Woolley A.T., Lieber C.M. Structural and functional imaging with carbon nanotube AFM probes. Prog. Biophys. Molecular Biol. 77:2001;73-110.
44. Han W., Lindsay S.M., Jing T. A magnetically driven oscillating probe microscope for operation in liquids. Appl. Phys. Lett. 69:1996;4111-4114.
45. Hansma H.G., et al. Recent advances in atomic force microscopy of DNA. Scanning. 15:1993;296-299.
46. Heaton MG, Prater CB, Kjoller KJ. Lateral and chemical force microscopy: mapping surface friction. Digital Instruments.
47. Hsu S, Fu L. Robust output high-gain feedback controllers for the atomic force microscope under high data sampling rate. Proc IEEE Int Conf Control Appl. Kohala Coast-Island HI, August 1999, pp. 1626-1631.
48. Hun Seong G., Kobatake E., Miura K., Nakazawa A., Aizawa M. Direct atomic force microscopy visualization of integration host factor-induced DNA bending structure of the promoter regulatory region on the pseudomonas TOL plasmid. Biochem. Biophys. Res. Commun. 291:2002;361-366.
49. Hutter J.L., Bechhoefer J. Calibration of atomic-force microscope tips. Rev. Scientific Instrum. 64(7):1993;1868-1873.
50. Israelachvili J.N. Intermolecular and surface forces. 1985;Academic Press, Boston, MA.
51. Itoh T, Kataoka K, Suga T. Characteristics of low force contact process for MEMS probe cards. Sensors and Actuators, A: Physical 97-98:462-467.
52. Tamayo J., Humphris A.D.L., Owen R.J., Miles M.J. High-Q dynamic force microscopy in liquid and its application to living cells. Biophys. J. 81:2001;526-537.
53. Jalili N, Dadfarnia M, Dawson DM. A fresh insight into the microcantilever-sample interaction problem in non-contact atomic force microscopy. ASME J Dyn Syst Measurements Control 2004;126:xx-xx+9.
54. Jalili N, Dadfarnia M, Dawson DM. Distributed-parameters base modeling and vibration analysis of micro-cantilevers used in atomic force microscopy. Proc 19th ASME Biennial Conf Mech Vib Noise, Symp Dyn Vibration Robotic Syst. Chicago, Illinois (September 2003).
55. Junno T., Carlsson S.B., Xu H., Montelius L., Samuelson L. Fabrication of quantum devices by angstrom-level manipulation of nanoparticles with an atomic force microscope. Appl. Phys. Lett. 72(5):1998;548.
56. Kaneko R., Miyamoto T., Andoh Y., Hamada E. Microwear. Thin Solid Films. 273(1-2):1996;105-111.
57. Kempf M., Göken M., Vehoff H. Nanohardness measurements for studying local mechanical properties of metals. Appl. Phys. A: Mater. Sci. Process. 66:1998;S843-S846.
58. Laxminarayana K, Jalili N. A review of modeling and operational modes of atomic force microscopy systems with application to molecular manufacturing. Proc 2003 ASME Int Mech Eng Congr Exposition, Symp. Nanoscale Dyn. Sensing Control. Washington DC (November 2003).
59. Leckband D. Measuring the forces that control protein interactions. Ann. Rev. Biophys. Biomol. Struct. 29:2000;126.
60. Lee G.U., Chrisey L.A., Colton R.J. Direct Measurement of the forces between complementary strands of DNA. Science. 266:1994;771-773.
61. Lewis R.A., Leach A.R. Current methods for site-directed structure generation. J. Computer-Aided Mol. Des. 8:1994;467-475.
62. Luckham P.F., Smith K. Direct measurement of recognition forces between proteins and membrane receptors. Faraday Discuss. 111:1999;307-320.
63. Ludwig M., Rief M., Schmidt L., Li H., Oesterhelt F., Gautel M., et al. AFM - a tool for single molecule experiments. Appl. Phys. A: Mater. Sci. Process. 68:1999;173-176.
64. Magonov S.N., Elings V.B., Whangbo M.H. Phase imaging and stiffness in tapping-mode atomic force microscopy. Surf. Sci. 375:1997;1385-1391.
65. Margeat E., Le Grimellec C., Royer C.A. Visualization of trp repressor and its complexes with DNA by atomic force microscopy. Biophys. J. 75:1998;2712-2720.
66. Marszalek P.E., Oberhauser A.F., Pang Y.P., Fernandez J.M. Polysaccharide elasticity governed by chair-boat transitions of the glucopyranose ring. Nature. 396:1998;661.
67. Marszalek P.E., Pang Y.P., Li H., El Yazal J., Oberhauser A.F., Fernandez J.M. Atomic levers control pyranose ring conformation. Proc. Nat. Acad. Sci. USA. 96:1999;7894-7898.
68. Martin Y., Williams C.C., Wikramasinghe H.K. Atomic force microscope-force mapping and profiling on a Sub 100-A§ scale. J. Appl. Phys. 61:1987;4723.
69. Mat-Arip Y., Garver K., Chen C., Sheng S., Shao Z., Guo P. Three-dimensional Interaction of Phi29 pRNA dimer probed by chemical modification interference, Cryo-AFM, and cross-linking. J. Biol. Chem. 276:2001;32575-32584.
70. x/Ti system. Appl. Phys. Lett. 68(1):1996;34.
71. Miyahara K., Nagashima N., Ohmura T., Matsuoka S. Evaluation of mechanical properties in nanometer scale using AFM-based nanoindentation tester. Nanostruct. Mater. 12(5):1999.
72. Mou J., Czajkowsky D.M., Zhang Y., Shao Z. High-resolution atomic-force microscopy of DNA: the pitch of the double helix. FEBS Lett. 371:1995;279-282.
73. Muller D.J., Engel A. The height of biomolecules measured with the atomic force microscope depends on electrostatic interactions. Biophys. J. 73:1997;1633-1644.
74. Muller D.J., Fotiadis D., Scheuring S., Muller S.A., Engel A. Electrostatically balanced subnanometer imaging of biological specimens by atomic force microscope. Biophys. J. 76:1999;1101-1111.
75. Nagashima N., Matsuoka S., Miyahara K. Nanoscopic hardness measurement by atomic force microscope. JSME Int. J., Series A: Mech. Mater. Eng. 39(3):1996;456-462.
76. Nagel LW. SPICE2: a computer program to simulate semiconductor circuits. University of California, Berkeley, Tech. Rep. Memo ERLM520, 1975.
77. Niedermann Ph., Hänni W., Blanc N., Christoph R., Burger J. Chemical vapor deposition diamond for tips in nanoprobe experiments. J. Vacuum Sci. Technol. A. 14:1996;1233.
78. Niedermann Ph., Hänni W., Morel D., Perret A., Skinner N., Indermühle P.F., et al. CVD diamond probes for nanotechnology. Appl. Phys. A. 66:1998;S31-S34.
79. Niedermann Ph., Hänni W., Thurre S., Gjoni M., Perret A., Skinner N., et al. Mounting of micromachined diamond tips and cantilevers. Surf. Interf. Anal. 27:1999;296-298.
80. 2 imaged with atomic force microscopy. Pflugers Arch. European J. Physiol. 439:2000;251-255.
81. Okada Y., Amano S., Iuchi Y., Kawabe M., Harris J.S. AlGaAs/GaAs tunneling diode integrated with nanometer-scale oxides patterned by atomic force microscope. Electron. Lett. 34(12):1998;1262-1263.
82. Okada Y., Amano S., Kawabe M., Shimbo B.N., Harris J.S. Nanoscale oxidation of GaAs-based semiconductors using atomic force microscope. J. Appl. Phys. 83(4):1998;1844-1847.
83. Olbrich A., Ebersberger B., Boit C., Niedermann P., Hänni W., Vancea J., et al. High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy. J. Vacuum Sci. Technol. B. 17(4):1999;1570-1574.
84. Ortiz C., Hadziioannou G. Entropic elasticity of single polymer chains of Poly (methylacrylic acid) measured by atomic force microscopy. Macromolecules. 32:1999;780-787.
85. Peppas N.A., Langer R. New challenges in biomaterials. Science. 263:1994;1715-1720.
86. Pickering J.P., Vancso G.J. Apparent contrast reversal in tapping mode atomic force microscope images on films of polystyrene-b-polyisoprene-b- polystyrene. Polym. Bull. 40:1998;549-554.
87. TM atomic force microscopy - applications to semiconductors. Digital Instruments, Veeco Metrology Group.
88. Rakowska A., Danker T., Schneider S.C., Oberleithner H. ATP-induced shape change of nuclear pores visualized with the atomic force microscope. J. Membrane Biol. 163(2):1998;129-136.
89. Ratcliff G.C., Erie D.A., Superfine R. Photothermal modulation for oscillating mode atomic force microscopy in solution. Appl. Phys. Lett. 72:1998;1911-1913.
90. Rief M., Fernandez J.M., Gaub H.E. Elastically coupled two-level systems as a model for biopolymer elasticity. Phys. Rev. Lett. 81:1998;4764-4767.
91. Rief M., Gautel M., Oesterhelt F., Fernandez J.M., Gaub H.E. Reversible unfolding of individual tin immunoglobulin domains by AFM. Science. 276:1997;1109-1112.
92. Rivetti C., Guthold M., Bustamante C. Wrapping of DNA around the E. coli RNA polymerase open promoter complex. EMBO J. 18:1999;4464-4475.
93. Sahin O., Atalar A. Analysis of tip-sample interaction in tapping-mode atomic force microscope using an electrical circuit simulator. Appl. Phys. Lett. 78(19):2001;2973-2975.
94. Salapaka M.V., Bergh H.S., Lai J., Majumdar A., McFarland E. Multimode noise analysis of cantilevers for scanning probe microscopy. J. Appl. Phys. 81(6):1997;2480-2487.
95. Salapaka M, Chen D. Stability and sensitivity analysis of periodic orbits in tapping mode atomic force microscopy. Proc Conf Decision Control. Tampa FL, December 1998, pp. 2047-2052.
96. Sasa S., Ikeda T., Akahori M., Kajiuchi A., Inoue M. Novel nanofabrication process for InAs/AlGaSb heterostructures utilizing atomic force microscope oxidation. Japanese J Appl Phys, Part 1: Regular Papers and Short Notes and Review Papers. 38(2B):1999;1064-1066.
97. Sasa S., Ikeda T., Dohno C., Inoue M. Atomic force microscope nanofabrication of InAs/AlGaSb heterostructures. Japanese J. Appl. Phys., Part 1: Regular Papers and Short Notes and Review Papers. 36(6B):1997;4065-4067.
98. Sasa S., Yodogawa S., Ohya S., Inoue M. A single-electron transistor produced by nanoscale oxidation of InAs. Japanese J Appl Phys, Part 1: Regular Papers and Short Notes and Review Papers. 40(3B):2001;2026-2028.
99. Scherer V., Bhushan B., Rabe U., Arnold W. Local elasticity and lubrication measurements using atomic force and friction force microscopy at ultrasonic frequencies. IEEE Trans. Mag. 33(5):1997;4077-4079.
100. Schoenenberger C.A., Hoh J. Immuno-atomic force microscopy of purple membrane. Biophys. J. 70(4):1996;1796.
101. Sebastian A, Salapaka M, Chen D, Cleveland J. Harmonic analysis based modeling of tapping-mode AFM. Proc Am Control Conf. San Diego CA, June 1999, pp. 232-236.
102. Serry F.M., Strausser E.Y.E., Magonov J., Thornton S.J., Ge L. Surface characterization using atomic force microscopy. Surf. Eng. 15(4):1999;285-290.
103. Serry F.M., Kjoller K., Thornton J.T., Tench R.J., Cook D. Electric force microscopy, surface potential imaging, and surface electric modification. Digital Instruments. 1999.
104. Shao Z., Shi D., Somlyo A.V. Cryoatomic force microscopy of filamentous actin. Biophys. J. 78:2000;950-958.
105. Shao Z., Zhang Y. Biological cryo atomic force microscopy: a brief review. Ultramicroscopy. 66:1996;141-152.
106. Shirakashi J.I., Matsumoto K., Miura N., Konagai M., Konagai M. Single-electron charging effects in Nb/Nb oxide-based single-electron transistors at room temperature. Appl. Phys. Lett. 72(15):1998;1893.
107. Shirakashi J.I., Matsumoto K., Miura N., Konagai M. Single-electron transistors (SETs) with Nb/Nb oxide system fabricated by atomic force microscope (AFM) nano-oxidation process. Japanese J. Appl. Phys., Part 2: Lett. 36(9):1997;1257-1260.
108. Smith S.B., Cui Y., Bustamante C. Overstretching B-DNA: the elastic response of individual double-stranded and single-stranded DNA molecules. Science. 271:1996;795-799.
109. Snow E.S., Campbell P.M. AFM fabrication of sub-10-nanometer metal-oxide devices with in situ control of electrical properties. Science. 270(5242):1995;1639.
110. Snow E.S., Campbell P.M. Fabrication of Si nanostructures with an atomic force microscope. Appl. Phys. Lett. 64(15):1994;1932.
111. Spatz J.P., Sheiko S., Möller M., Winkler R.G., Reineker R., Marti O. Forces affecting the substrate in resonant tapping force microscopy. Nanotechnology. 6:1995;40-44.
112. Stoffler D., Goldie K.N., Feja B., Aebi U. Calcium-mediated structural changes of native nuclear pore complexes monitored by time-lapse atomic force microscopy. J. Molecular Biol. 287:1999;741-752.
113. Stolz M., Stoffler D., Aebi U., Goldsbury C. Monitoring biomolecular interactions by time-lapse atomic force microscopy. J. Struct. Biol. 131:2000;171-180.
114. Strick T.R., Allemand J.F., Bensimon D., Bensimon A., Croquette V. The elasticity of single supercoiled DNA molecule. Science. 271:1996;1835-1837.
115. Sugawara Y., Ueyama H., Uchihashi T., Ohta M., Morita S., Suzuki M., et al. True atomic resolution imaging with non-contact atomic force microscopy. Appl. Surf. Sci. 113/114:1997;364-370.
116. Sugimura H, Uchida T, Kitamura N, Masuhara H. Scanning tunneling microscope tip-induced anodization of titanium: characterization of the modified surface and application to the metal resist process for nanolithography. J Vacuum Sci Technol B: Microelectron Nanometer Struct 12(5):2884-2888.
117. Sun E., Cohen F.E. Computer-assisted drug discovery - a review. Gene. 137:1993;127-132.
118. Sundararajan S., Bhushan B. Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultrathin hard amorphous carbon coatings. J. Mater. Res. 16(2):2001;437-445.
119. Umemura K., Nagami F., Okada T., Kuroda R. AFM characterization of single strand-specific endonuclease activity on linear DNA. Nucl. Acids Res. 28(9):2000;E39.
120. van Noort J., Orsini F., Eker A., Wyman C., de Grooth B., Greve J. DNA bending by photolyase in specific and non-specific complexes studied by atomic force microscopy. Nucl. Acids Res. 27:1999;3875-3880.
121. Westra K.L., Thomson D.J. Microstructure of thin films observed using atomic force microscopy. Thin Solid Films. 257(1):1995;15-21.
122. Wiesendanger R. Scanning probe microscopy and spectroscopy. 1994;Cambridge University Press, Great Britain.
123. Yamamoto A., Watanabe A., Tsubakino H., Fukumoto S. AFM observations of microstructures of deposited magnesium on magnesium alloys. Mater. Sci. Forum. 350:2000;241-246.
124. Yong Y., Hong W., Erie D.A. Quantitative characterization of biomolecular assemblies and interactions using atomic force microscopy. Methods. 29:2003;175-187.