Mapping of local electrical properties in epitaxial graphene using electrostatic force microscopy

Nano Letters

Volumn 11, Issue 6, 2011, Pages 2324-2328

  Burnett, Tim ^a   Yakimova, Rositza ^b   Kazakova, Olga ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

electrostatic force microscopy; Epitaxial graphene; phase contrast; surface potential

Indexed keywords

AMBIENT CONDITIONS; DC BIAS; ELECTRICAL CHARACTERIZATION; ELECTROSTATIC FORCE MICROSCOPY; ELEVATED TEMPERATURE; EPITAXIAL GRAPHENE; PHASE CONTRAST;

ELECTRIC PROPERTIES; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; EPITAXIAL GROWTH; GRAPHENE; SEMICONDUCTING SILICON COMPOUNDS; SILICON CARBIDE;

ELECTRIC FORCE MICROSCOPY;

GRAPHITE; INORGANIC COMPOUND; SILICON CARBIDE; SILICON DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRON; PARTICLE SIZE; SURFACE PROPERTY;

CARBON COMPOUNDS, INORGANIC; ELECTRONS; GRAPHITE; MICROSCOPY, ATOMIC FORCE; PARTICLE SIZE; SILICON COMPOUNDS; SURFACE PROPERTIES;

EID: 79958809297     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl200581g     Document Type: Article

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