Scanning Probe Microscopy

IEEE Control Systems

Volumn 28, Issue 2, 2008, Pages 65-83

  Salapaka, Murti V ^a   Salapaka, Srinivasa M ^b  

^a IOWA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INNOVATION; NANOSCIENCE; SCANNING TUNNELING MICROSCOPY;

ATOMIC SCALE; HIGH-DENSITY DATA STORAGE; NANOSCALE;

SCANNING PROBE MICROSCOPY;

EID: 41949117355     PISSN: 1066033X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCS.2007.914688     Document Type: Article

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