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Nanoscience and Nanotechnology Letters

Volumn 4, Issue 6, 2012, Pages 628-633

Advanced magnetic force microscopy for high resolution magnetic imaging

(5) Ranjbar, M a,b Piramanayagam, S N a Sbiaa, R a Chong, T C a,b Okamoto, I c

a DATA STORAGE INSTITUTE (Singapore)

b NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

c Western Digital Corporation (Singapore)

Author keywords

Antiferromagnetic coupling; Magnetic force microscopy; Perpendicular magnetic anisotropy

Indexed keywords

ANTIFERROMAGNETIC COUPLING; ANTIFERROMAGNETICS; CRYSTALLOGRAPHIC TEXTURES; HIGH DENSITY RECORDING MEDIA; HIGH RESOLUTION; IMAGING TOOLS; MAGNETIC IMAGING; MAGNETIC NANOSTRUCTURES; PERPENDICULAR MAGNETIC ANISOTROPY; RECORDING MEDIA; WRITTEN INFORMATION;

ANTIFERROMAGNETISM; MAGNETIC ANISOTROPY; NANOSTRUCTURED MATERIALS; TEXTURES;

MAGNETIC FORCE MICROSCOPY;

EID: 84864841526 PISSN: 19414900 EISSN: 19414919 Source Type: Journal
DOI: 10.1166/nnl.2012.1367 Document Type: Conference Paper

Times cited : (3)

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