On the dynamics of tapping mode atomic force microscope probes

Nonlinear Dynamics

Volumn 70, Issue 2, 2012, Pages 1605-1617

  Bahrami, Arash ^a   Nayfeh, Ali H ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Multimode Galerkin; Nonlinear dynamics; Tapping mode

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPE (AFM); CHAOTIC VIBRATION; EXCITATION AMPLITUDES; GALERKIN; GALERKIN APPROXIMATIONS; GRAZING BIFURCATION; HARMONIC EXCITATION; INTERACTION MODEL; MULTIMODES; NON-LINEAR PHENOMENA; NON-LINEAR RESPONSE; NON-SMOOTHNESS; NONLINEAR PARTIAL DIFFERENTIAL EQUATIONS; NONLINEARLY COUPLED; OPERATING PARAMETERS; PERIOD DOUBLING BIFURCATION; SINGLE MODE; SYSTEM DYNAMICS; TAPPING MODES; TIME EVOLUTIONS;

BIFURCATION (MATHEMATICS); DYNAMICS; EQUATIONS OF MOTION; GALERKIN METHODS; MATHEMATICAL MODELS; ORDINARY DIFFERENTIAL EQUATIONS; PARTIAL DIFFERENTIAL EQUATIONS;

ATOMIC FORCE MICROSCOPY;

EID: 84870991672     PISSN: 0924090X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11071-012-0560-6     Document Type: Article

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