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Volumn 51, Issue 21, 2012, Pages 5066-5072

Nanometer displacement measurement using Fresnel diffraction

Author keywords

[No Author keywords available]

Indexed keywords

PIEZOELECTRIC CERAMICS;

EID: 84864250003     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.51.005066     Document Type: Article
Times cited : (37)

References (27)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.