Electrochemical strain microscopy with blocking electrodes: The role of electromigration and diffusion

Journal of Applied Physics

Volumn 111, Issue 1, 2012, Pages

  Morozovska, A N ^a   Eliseev, E A ^b   Kalinin, S V ^c  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLOCKING ELECTRODES; DETECTION LIMITS; DYNAMIC SURFACE; ELECTROCHEMICAL PROCESS; ELECTROCHEMICAL REACTIONS; ELECTROCHEMICAL STRAIN; FREQUENCY DEPENDENCE; IMAGE FORMATION MECHANISMS; ION BATTERIES; IONIC FLOWS; ROLE OF DIFFUSION; SOLID STATE IONIC DEVICES;

ELECTRIC FIELDS; ELECTROMIGRATION; FREQUENCY RESPONSE; SCANNING PROBE MICROSCOPY; SOLID STATE DEVICES; STRAIN;

ELECTROCHEMICAL ELECTRODES;

EID: 84855917426     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3675508     Document Type: Article

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