On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopy

Ultramicroscopy

Volumn 128, Issue , 2013, Pages 32-41

  Passeri, D ^a   Rossi, M ^a   Vlassak, J J ^b  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b HARVARD UNIVERSITY   (United States)

Author keywords

Atomic force acoustic microscopy (AFAM); Contact resonance atomic force microscopy (CR AFM); Elastic modulus; Lateral force; Tip calibration

Indexed keywords

ATOMIC FORCE ACOUSTIC MICROSCOPY; CONTACT RESONANCE; ELASTIC MODULUS MEASUREMENTS; INDENTATION MODULUS; LATERAL FORCE; MODULUS MEASUREMENTS; NEW APPROACHES; TIP CALIBRATION; TIP-SAMPLE CONTACT;

CALIBRATION; COMPUTER SIMULATION; ELASTIC MODULI; NANOCANTILEVERS; RESONANCE;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; CONTACT RESONANCE ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; FORCE; LATERAL FORCE; MEASUREMENT ACCURACY; SIMULATION; TIP CALIBRATION;

EID: 84874783608     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.02.003     Document Type: Article

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