SCOPUS 정보 검색 플랫폼

Volumn 358, Issue 17, 2012, Pages 2082-2085

Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy

(5) Ledinský, Martin a Fejfar, Antonín a Vetushka, Aliaksei a Stuchlík, Jiří a Kočka, Jan a

a INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

Amorphous and nanocrystalline silicon films; Atomic force microscopy (AFM); Local photoconductivity

Indexed keywords

AFM; AMORPHOUS AND NANOCRYSTALLINE SILICON; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT INTENSITY; CURRENT LEVELS; DIFFUSION LENGTH; HE-CD LASERS; MICROCRYSTALLINE SILICON THIN FILMS;

NANOCANTILEVERS; PHOTOCONDUCTIVITY; THIN FILMS;

ATOMIC FORCE MICROSCOPY;

EID: 84865778401 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2012.01.015 Document Type: Conference Paper

Times cited : (5)

References (13)

1
- 0001682548
- B. Rezek, J. Stuchlík, A. Fejfar, and J. Kočka Appl. Phys. Lett. 74 1999 1475 1477
- (1999) Appl. Phys. Lett. , vol.74 , pp. 1475-1477
- Rezek, B.¹ Stuchlík, J.² Fejfar, A.³ Kočka, J.⁴

2
- 0036639047
- B. Rezek, J. Stuchlik, A. Fejfar, and J. Kočka J. Appl. Phys. 92 2002 587 593
- (2002) J. Appl. Phys. , vol.92 , pp. 587-593
- Rezek, B.¹ Stuchlik, J.² Fejfar, A.³ Kočka, J.⁴

3
- 33745448427
- T. Mates, P.C.P. Bronsveld, A. Fejfar, B. Rezek, J. Kočka, J.K. Rath, and R.E.I. Schropp J. Non-Cryst. Solids 352 2006 1011 1015
- (2006) J. Non-Cryst. Solids , vol.352 , pp. 1011-1015
- Mates, T.¹ Bronsveld, P.C.P.² Fejfar, A.³ Rezek, B.⁴ Kočka, J.⁵ Rath, J.K.⁶ Schropp, R.E.I.⁷

4
- 20144375865
- D. Azulay, I. Balberg, V. Chu, J.P. Conde, and O. Millo Phys. Rev. B 71 2005 113304
- (2005) Phys. Rev. B , vol.71 , pp. 113304
- Azulay, D.¹ Balberg, I.² Chu, V.³ Conde, J.P.⁴ Millo, O.⁵

5
- 77956321290
- A. Vetushka, A. Fejfar, M. Ledinsky, B. Rezek, J. Stuchlik, and J. Kočka Phys. Rev. B 81 2010 237301
- (2010) Phys. Rev. B , vol.81 , pp. 237301
- Vetushka, A.¹ Fejfar, A.² Ledinsky, M.³ Rezek, B.⁴ Stuchlik, J.⁵ Kočka, J.⁶

6
- 36749036057
- Z. Shen, M. Eguchi, T. Gotoh, N. Yoshida, T. Itoh, and S. Nonomura Thin Solid Films 516 2008 588 592
- (2008) Thin Solid Films , vol.516 , pp. 588-592
- Shen, Z.¹ Eguchi, M.² Gotoh, T.³ Yoshida, N.⁴ Itoh, T.⁵ Nonomura, S.⁶

7
- 73949118711
- D. Cavalcoli, F. Detto, M. Rossi, A. Tomasi, and A. Cavallini Nanotechnology 21 2010 045702
- (2010) Nanotechnology , vol.21 , pp. 045702
- Cavalcoli, D.¹ Detto, F.² Rossi, M.³ Tomasi, A.⁴ Cavallini, A.⁵

8
- 77955511625
- M. Kawai, T. Kawakami, T. Inaba, F. Ohashi, H. Natsuhara, T. Itoh, and S. Nonomura Curr. Appl. Phys. 10 2010 S392 S394
- (2010) Curr. Appl. Phys. , vol.10
- Kawai, M.¹ Kawakami, T.² Inaba, T.³ Ohashi, F.⁴ Natsuhara, H.⁵ Itoh, T.⁶ Nonomura, S.⁷

9
- 80155189605
- M. Ledinský, A. Fejfar, A. Vetushka, J. Stuchlík, B. Rezek, and J. Kočka Phys. Status Solidi RRL 5 2011 373 375
- (2011) Phys. Status Solidi RRL , vol.5 , pp. 373-375
- Ledinský, M.¹ Fejfar, A.² Vetushka, A.³ Stuchlík, J.⁴ Rezek, B.⁵ Kočka, J.⁶

10
- 77952575354
- M. Ledinský, A. Vetushka, J. Stuchlík, A. Fejfar, and J. Kočka Phys. Status Solidi (c) 7 2010 704 707
- (2010) Phys. Status Solidi (C) , vol.7 , pp. 704-707
- Ledinský, M.¹ Vetushka, A.² Stuchlík, J.³ Fejfar, A.⁴ Kočka, J.⁵

11
- 42649117816
- J. Kočka, T. Mates, M. Ledinský, H. Stuchlí ková, J. Stuchlík, and A. Fejfar Thin Solid Films 516 2008 4966 4969
- (2008) Thin Solid Films , vol.516 , pp. 4966-4969
- Kočka, J.¹ Mates, T.² Ledinský, M.³ Stuchlíková, H.⁴ Stuchlík, J.⁵ Fejfar, A.⁶

12
- 0037113648
- V. Magidson, and R. Beserman Phys. Rev. B 66 2002 195206
- (2002) Phys. Rev. B , vol.66 , pp. 195206
- Magidson, V.¹ Beserman, R.²

13
- 77950996730
- A. Fejfar, A. Vetushka, V. Kalusová, O. Čertík, M. Ledinský, B. Rezek, J. Stuchlík, and J. Kočka Phys. Status Solidi (a) 207 2010 582 586
- (2010) Phys. Status Solidi (A) , vol.207 , pp. 582-586
- Fejfar, A.¹ Vetushka, A.² Kalusová, V.³ Čertík, O.⁴ Ledinský, M.⁵ Rezek, B.⁶ Stuchlík, J.⁷ Kočka, J.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.