Study on the correlation between the photovoltaic effect and the defect density at the surface of a poly-Si solar cell by using photoconductive atomic force microscopy (PC-AFM)

Journal of the Korean Physical Society

Volumn 60, Issue 9, 2012, Pages 1322-1326

  Heo, Jinhee ^a   Rhyim, Youngmok ^a  

^a Korea Institute of Material Science   (South Korea)

Author keywords

Defect; Photoinduced current; Photovoltaic; Scanning probe microscopy (SPM); Solar cell

Indexed keywords

EID: 84863633635     PISSN: 03744884     EISSN: 19768524     Source Type: Journal    
DOI: 10.3938/jkps.60.1322     Document Type: Article

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