Measuring the charge state of an adatom with noncontact atomic force microscopy

Science

Volumn 324, Issue 5933, 2009, Pages 1428-1431

  Gross, Leo ^a   Mohn, Fabian ^a   Liljeroth, Peter ^a,b   Repp, Jascha ^a,c   Giessibl, Franz J ^c   Meyer, Gerhard ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b UTRECHT UNIVERSITY   (Netherlands)

^c UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; SILVER; SODIUM CHLORIDE;

ATOMIC FORCE MICROSCOPY; CATALYSIS; ELECTRICAL PROPERTY; ELECTRONIC EQUIPMENT; GOLD; OPTICAL INSTRUMENT; SCANNING TUNNELLING MICROSCOPY; SILVER; SODIUM CHLORIDE; SUBSTRATE;

ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; ELECTRON; FILM; MOLECULAR INTERACTION; OSCILLATION; PARTICLE SIZE; POTENTIAL DIFFERENCE; PRIORITY JOURNAL; SURFACE CHARGE;

EID: 67149108352     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1172273     Document Type: Article

References (30)

1. Y. Sugimoto et al., Nature 446, 64 (2007).
2. Y. Sugimoto et al., Nat. Mater. 4, 156 (2005).
3. Y. Sugimoto et al., Science 322, 413 (2008).
4. M. Ternes, C. P. Lutz, C. F. Hirjibehedin, F. J. Giessibl, A. J. Heinrich, Science 319, 1066 (2008).
5. M. Nonnenmacher, M. P. O'Boyle, H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).
6. S. Kitamura, K. Suzuki, M. Iwatsuki, C. B. Mooney, Appl. Surf. Sci. 157, 222 (2000).
7. K. Okamoto, Y. Sugawara, S. Morita, Appl. Surf. Sci. 188, 381 (2002).
8. M. Ikeda, N. Koide, L. Han, A. Sasahara, H. Onishi, J. Phys. Chem. C 112, 6961 (2008).
9. G. H. Enevoldsen, T. Glatzel, M. C. Christensen, J. V. Lauritsen, F. Besenbacher, Phys. Rev. Lett. 100, 236104 (2008).
10. F. Bocquet, L. Nony, C. Loppacher, T. Glatzel, Phys. Rev. B 78, 035410 (2008).
11. K. Uchida, in Nanoelectronics and Information Technology: Advanced Electronic Materials and Novel Devices, R. Waser, Ed. (Wiley, New York, 2003), chap. 16.
12. K. K. Likharev, IEEE Proc. 87, 606 (1999).
13. M. Haruta, Catal. Today 36, 153 (1997).
14. J. Repp, G. Meyer, F. E. Olsson, M. Persson, Science 305, 493 (2004).
15. F. E. Olsson, S. Paavilainen, M. Persson, J. Repp, G. Meyer, Phys. Rev. Lett. 98, 176803 (2007).
16. M. Sterrer et al., Phys. Rev. Lett. 98, 096107 (2007).
17. C. Schoenenberger, S. F. Alvarado, Phys. Rev. Lett. 65, 3162 (1990).
18. L. J. Klein, C. C. Williams, Appl. Phys. Lett. 79, 1828 (2001).
19. R. Stomp et al., Phys. Rev. Lett. 94, 056802 (2005).
20. J. Zhu, M. Brink, P. L. McEuen, Appl. Phys. Lett. 87, 242102 (2005).
21. E. Bussmann, N. Zheng, C. C. Williams, Appl. Phys. Lett. 86, 163109 (2005).
22. E. Bussmann, C. C. Williams, Appl. Phys. Lett. 88, 263108 (2006).
23. Y. Azuma, M. Kanehara, T. Teranishi, Y. Majima, Phys. Rev. Lett. 96, 016108 (2006).
24. F. J. Giessibl, Rev. Mod. Phys. 75, 949 (2003).
25. F. J. Giessibl, Appl. Phys. Lett. 76, 1470 (2000).
26. Materials and methods are available as supporting material on Science Online.
27. T. Albrecht, P. Grütter, D. Horne, D. Rugar, J. Appl. Phys. 69, 668 (1991).
28. J. E. Sader, S. P. Jarvis, Appl. Phys. Lett. 84, 1801 (2004).
29. * because of the atoms' charge state are not tip-dependent, allowing the determination of the charge states by comparison. In general, we observed higher shifts in the LCPD for smaller tip-sample separations and for tips exhibiting a small background force (that is, presumably very sharp tips).
30. We thank R. Allenspach for valuable comments. This work was supported by the Swiss National Center of Competence in Research (NCCR) "Nanoscale Science" and by the European Union project "NanoMan." P.L. and J.R. gratefully acknowledge funding by the Nederlandse Organisatie voor Wetenschappelijk Onderzoek (Chemical Sciences, Vidi-grant 700.56.423) and Volkswagen Foundation through its Lichtenberg program, respectively.