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Volumn 6, Issue 5, 2013, Pages

Mechanical properties of various phases on In/Si(111) surfaces revealed by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

1 PHASE; ATOMIC LAYER; ATOMIC SCALE; DYNAMICAL FLUCTUATIONS; ROOM TEMPERATURE; SI SUBSTRATES;

EID: 84880873539     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.7567/APEX.6.055201     Document Type: Article
Times cited : (16)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.