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Volumn 10, Issue 7, 2010, Pages 4400-4410

Nano-scale simulative measuring model for tapping mode atomic force microscopy and analysis for measuring a nano-scale ladder-shape standard sample

Author keywords

Edge Effect; Fixed Amplitude; Simulative Measurement; Tapping Mode Atomic Force Microscopy; Vibration

Indexed keywords

EDGE EFFECT; FIXED-AMPLITUDE; SIMULATIVE MEASUREMENT; TAPPING-MODE ATOMIC FORCE MICROSCOPY; VIBRATION;

LADDERS; MEASUREMENTS; NANOSTRUCTURED MATERIALS; PROBES; ROADS AND STREETS; STANDARDS;

ATOMIC FORCE MICROSCOPY;

EID: 79955423760 PISSN: 15334880 EISSN: None Source Type: Journal
DOI: 10.1166/jnn.2010.2375 Document Type: Conference Paper

Times cited : (1)

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