Noncontact potentiometry of polymer field-effect transistors

Applied Physics Letters

Volumn 80, Issue 16, 2002, Pages 2913-2915

  Burgi L ^a   Sirringhaus, H ^a   Friend, R H ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATION LAYERS; ELECTROSTATIC POTENTIALS; FIELD-EFFECT MOBILITIES; GATE BIAS; HIGH RESOLUTION; LATERAL ELECTRIC FIELD; NON-CONTACT; ORGANIC THIN FILMS; POLYMER FIELD EFFECT TRANSISTORS; POTENTIOMETRY; SCANNING KELVIN PROBE FORCE MICROSCOPY; SEMICONDUCTOR/INSULATOR INTERFACES;

ELECTRIC FIELDS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS);

ORGANIC FIELD EFFECT TRANSISTORS;

EID: 79956024105     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1470702     Document Type: Article

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