High-resolution work function imaging of single grains of semiconductor surfaces

Applied Physics Letters

Volumn 80, Issue 16, 2002, Pages 2979-2981

  Sadewasser, S ^a   Glatzel, Th ^a   Rusu, M ^a   Jager Waldau A ^a   Lux Steiner, M Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; ELECTRONIC DEVICE; FUNCTION VARIATION; GROWING DEMAND; HIGH RESOLUTION; KELVIN PROBE FORCE MICROSCOPES; MATERIAL PROPERTY; NANO-METER SCALE; ORIENTED CRYSTALS; SEMI-CONDUCTOR SURFACES; SINGLE GRAINS; SIZE REDUCTIONS; SOLAR CELL MATERIALS; SOLAR POWER CONVERSION;

CONVERSION EFFICIENCY; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR DEVICES; SOLAR ENERGY; WORK FUNCTION;

SURFACES;

EID: 79956045283     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1471375     Document Type: Article

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