Kelvin probe force microscopy on surfaces of UHV cleaved ionic crystals

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Barth, Clemens ^a   Henry, Claude R ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

IONIC CONDUCTION; MAGNESIA; POTASSIUM COMPOUNDS; SODIUM CHLORIDE;

KELVIN PROBE FORCE MICROSCOPY (KPFM); ROOM TEMPERATURE; SURFACE POTENTIAL;

SURFACE MEASUREMENT;

EID: 33644983425     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S09     Document Type: Article

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