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Volumn 13, Issue 1, 2009, Pages 9-15

Metal-to-oxide charge transfer observed by a kelvin probe force microscope

Author keywords

Atomic force microscope; Characterization; Charge transfer; Chemical shift; Chlorine; Nickel; Platinum; Scanning Probe Microscope; Sodium; Titanium oxide; XPS

Indexed keywords


EID: 63949084767     PISSN: 15711013     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10563-009-9062-z     Document Type: Article
Times cited : (17)

References (24)
  • 24
    • 63949085690 scopus 로고    scopus 로고
    • Ohta M, Watanabe K, Kokawa R, Kobayashi K, Yamada H, Sasahara A, Onishi H (to be submitted)
    • Ohta M, Watanabe K, Kokawa R, Kobayashi K, Yamada H, Sasahara A, Onishi H (to be submitted)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.