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Volumn 13, Issue 1, 2009, Pages 9-15
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Metal-to-oxide charge transfer observed by a kelvin probe force microscope
a
KOBE UNIVERSITY
(Japan)
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Author keywords
Atomic force microscope; Characterization; Charge transfer; Chemical shift; Chlorine; Nickel; Platinum; Scanning Probe Microscope; Sodium; Titanium oxide; XPS
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Indexed keywords
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EID: 63949084767
PISSN: 15711013
EISSN: None
Source Type: Journal
DOI: 10.1007/s10563-009-9062-z Document Type: Article |
Times cited : (17)
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References (24)
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