Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 23, 2008, Pages

  Krok, F ^a   Sajewicz, K ^a   Konior, J ^a   Goryl, M ^a   Piatkowski, P ^a   Szymonski, M ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 45749122319     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.235427     Document Type: Article

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