Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 251-255

  Leveque G ^a   Girard, P ^a   Skouri, E ^b   Yarekha, D ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b IBN ZOHR UNIVERSITY   (Morocco)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SURFACE TOPOGRAPHY; VOLTAGE MEASUREMENT;

GALLIUM ANTIMONIDE; KELVIN PROBE FORCE MICROSCOPY (KPFM);

SEMICONDUCTOR LASERS;

EID: 0343826158     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00535-8     Document Type: Article

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