Role of defects in the nucleation and growth of Au nanoclusters on SiO 2 thin films

Journal of Physical Chemistry B

Volumn 108, Issue 42, 2004, Pages 16339-16343

  Min, B K ^a   Wallace, W T ^a   Santra, A K ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER DENSITY; METAL PARTICLE MORPHOLOGY; NANOCLUSTERS; OXIDE SURFACES;

ANNEALING; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; GROWTH (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; NANOSTRUCTURED MATERIALS; NUCLEATION; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON COMPOUNDS; THIN FILMS;

GOLD;

EID: 7644235863     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp046519p     Document Type: Article

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