Atom-resolved imaging of the potential distribution at Si (111) 7 × 7 surfaces

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 41, Issue 10 B, 2002, Pages

  Shiota, Tadashi ^a   Nakayama, Keiji ^a  

^a NIAITS   (Japan)

Author keywords

AFM; Atom resolved image; Contrast inversion; Noncontact; Si(111); SKPM

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DEFECTS; ELECTRIC CONDUCTIVITY; TEMPERATURE;

ATOM-RESOLVED IMAGING; CONTRAST INVERSION; SCANNING KELVIN PROBE MICROSCOPY;

SILICON;

EID: 0037110149     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.l1178     Document Type: Article

References (22)

1. J. M. R. Weaver and D. W. Abraham: J. Vac. Sci. & Technol. B 9 (1991) 1559.
2. M. Nonnenmacher, M. P. O'Byle and H. K. Wickramasinghe: Appl. Phys. Lett. 58 (1991) 2921.
3. R. Shikler, T. Meoded, N. Fried and Y. Rosenwaks: Appl. Phys. Lett. 74 (1999) 2972.
4. K. Matsunami, T. Takeyama, T. Usunami, S. Kishimoto, K. Maezawa, T. Mizutani, M. Tomizawa, P. Schmid, K. M. Lipka and E. Kohn: Solid State Electron. 43 (1999) 1547.
5. K. Kobayashi, H. Yamada, T. Horiuchi and K. Matsushige: Appl. Surf. Sci. 157 (2000) 228.
6. S. Ono, M. Takeuchi and T. Takahashi: Appl. Phys. Lett. 78 (2001) 1086.
7. A. Chavez-Pirson, O. Vatel, M. Tanimoto, H. Ando, H. Iwamura and H. Kanbe: Appl. Phys. Lett. 67 (1996) 3069.
8. S. Kitamura and M. Iwatsuki: Appl. Phys. Lett. 72 (1998) 3154.
9. S. Kitamura, K. Suzuki, M. Iwatsuki and C. B. Mooney: Appl. Surf. Sci. 157 (2000) 227.
10. F. J. Giessibl: Science 267 (1995) 68.
11. Y. Sugawara, M. Ohta, H. Ueyama and S. Morita: Science 270 (1995) 1646.
12. K. Fukui, H Onishi and Y. Iwasawa: Phys. Rev. Lett. 79 (1997) 4202.
13. K. Yokoyama, T. Ochi, A. Yoshimoto, Y. Sugawara and S. Morita: Jpn. J. Appl. Phys. 39 (2000) L113.
14. A. S. Forster, C. Barth, A. L. Shluger and M. Reichling: Phys. Rev. Lett. 86 (2001) 2373.
15. T. Shiota and K. Nakayama: Jpn. J. Appl. Phys. 40 (2001) L986.
16. T. R. Albrecht, P. Gruter, D. Horne and D. Rugar: J. Appl. Phys. 69 (1991) 668.
17. L. Zhang and K. Nakayama: Mater. Res. Soc. Symp. Proc. 558 (2000) 161.
18. Y. Sugawara, M. Ohta, H. Ueyama, S. Morita, F. Osaka, S. Ohkouchi, M. Suzuki and S. Mishima: J. Vac. Sci. & Technol. B 14 (1996) 953.
19. Y. Sugawara, H. Ueyama, T. Uchihashi, M. Ohta, S. Morita, M. Suzuki and S. Mishima: Appl. Surf. Sci. 113/114 (1997) 364.
20. M. Ohta, H. Ueyama, Y. Sugawara and S. Morita: Jpn. J. Appl. Phys. 34 (1995) L1692.
21. R. Perez, M. C. Payne, I. Stich and K. Terakura: Phys. Rev. Lett. 78 (1997) 678.
22. T. Uchihashi, Y. Sugawara, T. Tsukamoto, M. Ohta and S. Morita: Phys. Rev. B 56 (1997) 9834.