Measurement of built-in electrical potential in III-V solar cells by scanning Kelvin probe microscopy

Journal of Applied Physics

Volumn 93, Issue 12, 2003, Pages 10035-10040

  Jiang, Chun Sheng ^a   Moutinho, H R ^a   Friedman, D J ^a   Geisz, J F ^a   Al Jassim, M M ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR JUNCTIONS; SHORT CIRCUIT CURRENTS;

BAND GAP;

SOLAR CELLS;

EID: 0038819645     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1573736     Document Type: Article

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