Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 263-268

  Sommerhalter, Ch ^a   Glatzel, Th ^a   Matthes, Th W ^a   Jager Waldau A ^a   Lux Steiner, M Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTROSTATICS; FULLERENES; GRAPHITE; NATURAL FREQUENCIES; VACUUM APPLICATIONS; VOLTAGE MEASUREMENT;

CONTACT POTENTIAL DIFFERENCE; KELVIN PROBE FORCE MICROSCOPY (KPFM); WORK FUNCTION;

SEMICONDUCTING SILICON;

EID: 0033732923     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00537-1     Document Type: Article

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