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Physical Review Letters

Volumn 103, Issue 3, 2009, Pages

Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy

(4) Nony, Laurent a Foster, Adam S c,d Bocquet, Franck a,b Loppacher, Christian a,b

a AIX MARSEILLE UNIVERSITÉ (France)

b CNRS (France)

c TAMPERE UNIVERSITY OF TECHNOLOGY (Finland)

d AALTO UNIVERSITY (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ALKALI HALIDES; ATOMIC FORCE MICROSCOPY;

ALKALI-HALIDE CRYSTALS; APPLIED BIAS VOLTAGE; ATOMIC SCALE CONTRAST; ATOMISTIC SIMULATIONS; CONTACT POTENTIAL DIFFERENCE; INDUCED POLARIZATION; KELVIN PROBE FORCE MICROSCOPY; TIP-SAMPLE INTERACTION;

PROBES;

EID: 68649095215 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.103.036802 Document Type: Article

Times cited : (68)

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