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Volumn 76, Issue 20, 2000, Pages 2907-2909

Investigation of the cleaved surface of a p-i-n laser using Kelvin probe force microscopy and two-dimensional physical simulations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000739081     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126513     Document Type: Article
Times cited : (62)

References (15)
  • 8
    • 0345925082 scopus 로고
    • Traditional modeling of semiconductor devices
    • Plenum, New York
    • C. M. Snowden, Traditional Modeling of Semiconductor Devices, in NATO ASI series. Series B, Physics (Plenum, New York 1995), Vol. 342, pp. 41-76.
    • (1995) NATO ASI Series. Series B, Physics , vol.342 , pp. 41-76
    • Snowden, C.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.