Novel probes for molecular electronics

Science

Volumn 324, Issue 5933, 2009, Pages 1397-1398

  Meyer, Ernst ^a   Glatzel, Thilo ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL REACTION; ELECTRICAL PROPERTY; ELECTRONIC EQUIPMENT; OPTICAL METHOD; PHOTOVOLTAIC SYSTEM; SCANNING TUNNELLING MICROSCOPY; SUBSTRATE; TECHNOLOGICAL DEVELOPMENT; WAVE FIELD;

ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRICITY; LOW TEMPERATURE; MOLECULAR ELECTRONICS; MOLECULAR IMAGING; MOLECULAR INTERACTION; MOLECULAR PROBE; PHOTOCHEMISTRY; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SHORT SURVEY;

EID: 67149089290     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1175869     Document Type: Short Survey

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