The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 11, 2003, Pages 7163-7168

  Okamoto, Kenji ^a,b   Sugawara, Yasuhiro ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

^b Bldg 142   (United States)

Author keywords

Atomic resolution; Contact potential difference; Imaging mechanism; Kelvin probe force microscopy; Noncontact atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; ELECTRIC CHARGE; ELECTRIC POTENTIAL; ELECTROSTATICS; IMAGE ANALYSIS; OPTICAL RESOLVING POWER; OSCILLATIONS;

KELVIN PROBE FORCE MICROSCOPY; TOPOGRAPHICAL FORCES;

SURFACE STRUCTURE;

EID: 1642495655     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.7163     Document Type: Article

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