Local measurement of semiconductor band bending and surface charge using Kelvin probe force microscopy

Surface Science

Volumn 574, Issue 2-3, 2005, Pages

  Saraf, S ^a   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Kelvin Probe force microscopy; Semiconductor surface; Surface band bending; Surface charge; Surface potential; Surface states

Indexed keywords

KELVIN PROBE FORCE MICROSCOPY; SURFACE BAND BENDING; SURFACE POTENTIAL; SURFACE STATES;

BAND STRUCTURE; CHARGE TRANSFER; ELECTROSTATICS; LAPLACE TRANSFORMS; POISSON DISTRIBUTION; SPECTROSCOPIC ANALYSIS; SURFACE CHEMISTRY; SURFACE PROPERTIES;

CRYSTAL DEFECTS;

EID: 11344288075     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.10.042     Document Type: Article

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