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Volumn 113, Issue 1, 2009, Pages 247-253

Kelvin probe force microscopy on MgO(001) surfaces and supported Pd nanoclusters

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED DEFECTS; CLEAN SURFACES; KELVIN PROBE FORCE MICROSCOPIES; MGO (001) SURFACE; NEGATIVE CHARGES; PD CLUSTERS; SUPPORTED PALLADIUMS; SUPPORTED PD; VOLTAGE DIFFERENCES; WORK-FUNCTION DIFFERENCES;

EID: 65249137012     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp807340k     Document Type: Article
Times cited : (42)

References (78)
  • 27
    • 65249167233 scopus 로고    scopus 로고
    • Ph.D. Thesis; Ulm, Germany
    • Gleitsmann, T. Ph.D. Thesis; Ulm, Germany, 2007.
    • (2007)
    • Gleitsmann, T.1
  • 53
    • 0037508620 scopus 로고    scopus 로고
    • Geneste, G.; Morillo, J.; Finocchi, F. Surf. Sci. 2003, 532535, 508.
    • Geneste, G.; Morillo, J.; Finocchi, F. Surf. Sci. 2003, 532535, 508.
  • 54
    • 65249092230 scopus 로고    scopus 로고
    • Ph.D. Thesis; Toulouse
    • Geneste, G.; Ph.D. Thesis; Toulouse, 2003.
    • (2003)
    • Geneste, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.