KPFM imaging of Si(1 1 1) 5√3 × 5√3-Sb surface for atom distinction using NC-AFM

Applied Surface Science

Volumn 210, Issue 1-2 SPEC., 2003, Pages 128-133

  Okamoto, Kenji ^a   Yoshimoto, Kentaro ^a   Sugawara, Yasuhiro ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atom distinction; Atomic resolution; Electrostatic force measurement; Kelvin probe force microscopy (KPFM); Noncontact atomic force microscopy (NC AFM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SILICON;

KELVIN PROBE FORCE MICROSCOPY (KPFM); SURFACE POTENTIAL;

SURFACE TOPOGRAPHY;

EID: 0037474581     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01492-7     Document Type: Conference Paper

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