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Volumn 668, Issue , 2001, Pages

Characterization of the CuGaSe2/ZnSe interface using Kelvin Probe Force Microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER COMPOUNDS; CRYSTAL GROWTH; HETEROJUNCTIONS; SEMICONDUCTING ZINC COMPOUNDS; SINGLE CRYSTALS; SOLAR CELLS;

EID: 0035556424     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-668-h5.4     Document Type: Conference Paper
Times cited : (12)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.