Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 3, 2008, Pages

  Bocquet, Franck ^a,b   Nony, Laurent ^a,b   Loppacher, Christian ^a,b   Glatzel, Thilo ^c  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b CNRS   (France)

^c UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 47349114511     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.035410     Document Type: Article

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45. As a matter of fact, hd being very large, it can readily be verified that this result is always true whatever is the exact shape of the mesoscopic part of the tip apex.
46. It must be noticed that the resonance frequency of that mode might be shifted owing to the influence of the overall attractive force, i.e., including Van der Waals, short-range, and electrostatic components, similar to the resonance frequency of the fundamental mode.
47. In Ref., the foremost unstable atom of the tip which is responsible for the contrast in dissipation is triggered at a distance of about 3Å from the surface. Above that threshold, no instability is observed.