Potential imaging of operating light-emitting devices using Kelvin force microscopy

Applied Physics Letters

Volumn 74, Issue 20, 1999, Pages 2972-2974

  Shikler, R ^a   Meoded, T ^a   Fried, N ^a   Rosenwaks, Y ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000205980     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123983     Document Type: Article

References (8)

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