Emerging trends in surface metrology

CIRP Annals - Manufacturing Technology

Volumn 51, Issue 2, 2002, Pages 701-723

  Lonardo, P M ^a   Lucca, D A ^b   De Chiffre, L ^c  

^a UNIVERSITY OF GENOA   (Italy)

^b OKLAHOMA STATE UNIVERSITY   (United States)

^c NONE

Author keywords

Metrology; Surface; Surface integrity

Indexed keywords

CALIBRATION; PRODUCTION ENGINEERING; SURFACE ROUGHNESS; SURFACE STRUCTURE; SURFACE TOPOGRAPHY; TRACE ANALYSIS;

SURFACE INTEGRITY; SURFACE METROLOGY;

SURFACE MEASUREMENT;

EID: 0036978182     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)61708-9     Document Type: Article

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