Surface potential measurements using the Kelvin probe force microscope

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 279-283

  Yasutake, Masatoshi ^a   Aoki, Daisuke ^b   Fujihira, Masamichi ^b  

^a SEIKO INSTRUMENTS INC   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Conductivity; Langmuir Blodgett films; Surface potential

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC VARIABLES MEASUREMENT; ELECTROSTATICS; LANGMUIR BLODGETT FILMS; PROBES; SERVOMECHANISMS; SURFACE DISCHARGES;

KELVIN PROBE FORCE MICROSCOPE; POTENTIAL RESOLUTION; SURFACE POTENTIAL MEASUREMENTS; TOPOGRAPHIC IMAGE;

MICROSCOPES;

EID: 0030080427     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06772-8     Document Type: Article

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