A combined scanning tunnelling microscope and x-ray interferometer

Measurement Science and Technology

Volumn 12, Issue 10, 2001, Pages 1660-1665

  Yacoot, Andrew ^a   Kuetgens, Ulrich ^b   Koenders, Ludger ^b   Weimann, Thomas ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Nanotechnology; Scanning probe microscopy; X ray interferometry

Indexed keywords

CALIBRATION; INTERFEROMETERS; SILICON; X RAY APPARATUS;

GRATING STRUCTURES;

SCANNING TUNNELING MICROSCOPY;

INTERFEROMETRY; MICROSCOPY; NANOTECHNOLOGY; X-RAY TECHNIQUE;

EID: 0035477313     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/12/10/306     Document Type: Article

References (22)

1. Special issue on the 1998 CODATA internationally recommended values
2. Nanometre scale transfer standards