Non-linear surface deformation of the (1010) plane of sapphire: Identification of the linear features around spherical impressions

Acta Materialia

Volumn 47, Issue 17, 1999, Pages 4329-4338

  Nowak, R ^a,c   Sekino, T ^b   Niihara, K ^b  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy (AFM); Critical phenomena phase transformations; Nano indentation; Scanning electron microscopy (SEM)

Indexed keywords

EID: 0012965957     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00316-X     Document Type: Article

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