Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

Applied Physics Letters

Volumn 77, Issue 1, 2000, Pages 106-108

  Buh, G H ^a   Chung, H J ^a   Kim, C K ^a   Yi, J H ^a   Yoon, I T ^a   Kuk, Y ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000936308     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126892     Document Type: Article

References (14)

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