Some theoretical aspects of surface peak parameters

Precision Engineering

Volumn 23, Issue 2, 1999, Pages 94-102

  Whitehouse, D J ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

RANDOM PROCESSES; TRIBOLOGY;

MULTINORMAL THEORY; SURFACE PEAK PARAMETERS;

SURFACE MEASUREMENT;

EID: 0032670773     PISSN: 01416359     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0141-6359(98)00030-0     Document Type: Article

References (9)

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3. Whitehouse D.J. An improved wavefilter for use in the measurement of surface texture. I Mech E. 182:(3K):1967;306.
4. Whitehouse D.J. Handbook of Surface Metrology. 1994;62 Inst. of Physics, Bristol and Philadelphia.
5. Bendat J.S. Principles and Applications of Random Noise Theory. 1958;Wiley, New York.
6. Rice R.O. Mathematical analysis of random noise. Bell Syst Tech J. 23:1944;28.
7. ISO Standard Handbook. Limits, Fits and Surface Properties ISO. Applied Metrology 1988;33.
8. Hingle HT. Proc. VIII Int. Oberflachen Kolloq. Chemnitz, 1992, p. 151.
9. Whitehouse DJ. An identification of two functionally different peak forms in a random process. Proc I Mech E Series C Eng Sci 1999. (in press).