Wavelength-dependent measurement and evaluation of surface topographies: Application of a new concept of window roughness and surface transfer function

Wear

Volumn 237, Issue 2, 2000, Pages 231-252

  Wieland, M ^a,b   Hanggi P ^c   Hotz, W ^c   Textor, M ^b   Keller, B A ^a   Spencer, N D ^b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b ETH ZURICH   (Switzerland)

^c Alusuisse Technology and Management AG   (Switzerland)

Author keywords

Average filter; Fast Fourier transformation; Low and high frequency filter; Non contact laser profilometer; Surface engineering; Surface roughness; Surface topography; Surface transfer function; Surface wavelength dependent roughness; Window roughness

Indexed keywords

ALUMINUM; FAST FOURIER TRANSFORMS; STEEL; SURFACE MEASUREMENT; SURFACE TREATMENT; TITANIUM; TRANSFER FUNCTIONS;

AVERAGE FILTERING; NON CONTACT LASER PROFILOMETER; SURFACE TOPOGRAPHY; WAVELENGTH DEPENDENT ROUGHNESS EVALUATION;

SURFACE ROUGHNESS;

FOURIER TRANSFORM; LASER MEASUREMENT; SURFACE ROUGHNESS;

EID: 0343293794     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(99)00347-6     Document Type: Article

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