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Volumn 210, Issue 2, 1996, Pages 159-165

Dynamics and trackability of stylus systems

Author keywords

Measuring instruments; Surface

Indexed keywords

DAMPING; DYNAMICS; INSTRUMENTS; MATHEMATICAL MODELS; OPTIMIZATION; SENSORS; SURFACES; TRANSDUCERS;

EID: 0029734335     PISSN: 09544054     EISSN: None     Source Type: Journal    
DOI: 10.1243/PIME_PROC_1996_210_101_02     Document Type: Article
Times cited : (2)

References (10)
  • 1
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    • Dynamic aspects of scanning surface instruments and microscopes
    • Whitehouse, D. J. Dynamic aspects of scanning surface instruments and microscopes. Nanotechnology, 1990, 1, 93.
    • (1990) Nanotechnology , vol.1 , pp. 93
    • Whitehouse, D.J.1
  • 3
    • 33746991844 scopus 로고
    • The determination of squeeze film damping in capacitance based cantilever force probes
    • Xu, Y. and Smith, S. T. The determination of squeeze film damping in capacitance based cantilever force probes. Proceedings of Eighth Annual Meeting of the ASPE, 1993, p. 329.
    • (1993) Proceedings of Eighth Annual Meeting of the ASPE , pp. 329
    • Xu, Y.1    Smith, S.T.2
  • 4
    • 33746967765 scopus 로고
    • Harris, C. M. and Crede, C. E. (Eds) McGraw-Hill, New York
    • Harris, C. M. and Crede, C. E. (Eds) Shick and vibration handbook, 3rd edition, 1988 (McGraw-Hill, New York).
    • (1988) Shick and Vibration Handbook, 3rd Edition
  • 6
    • 33746973406 scopus 로고
    • PhD thesis, Warwick University
    • Howard, L. PhD thesis, Warwick University, 1993.
    • (1993)
    • Howard, L.1
  • 8
    • 0023800321 scopus 로고
    • A revised philosophy of surface measuring systems
    • Whitehouse, D. J. A revised philosophy of surface measuring systems. Proc. Instn Mech. Engrs, Part C, 1988, 202(C3), 169.
    • (1988) Proc. Instn Mech. Engrs, Part C , vol.202 , Issue.C3 , pp. 169
    • Whitehouse, D.J.1
  • 10
    • 0027887887 scopus 로고
    • Improvement of the fidelity of surface measurement by active damping control
    • Liu, X., Chetwynd, D. G., Smith, S. T. and Wang, W. Improvement of the fidelity of surface measurement by active damping control. Measmt Sci. Technol., 1993, 4, 1330.
    • (1993) Measmt Sci. Technol. , vol.4 , pp. 1330
    • Liu, X.1    Chetwynd, D.G.2    Smith, S.T.3    Wang, W.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.