Quantitative characterization of surface texture

CIRP Annals - Manufacturing Technology

Volumn 49, Issue 2, 2000, Pages 635-642

  De Chiffre, L ^a   Lonardo, P ^b   Trumpold, H ^c   Lucca, D A ^d   Goch, G ^e   Brown, C A ^e   Raja, J ^g   Hansen, H N ^f  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF GENOA   (Italy)

^c CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^d OKLAHOMA STATE UNIVERSITY   (United States)

^e UNIVERSITY OF BREMEN   (Germany)

^f WORCESTER POLYTECHNIC INSTITUTE   (United States)

^g UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; FRACTALS; FUNCTIONAL ASSESSMENT; PARAMETER ESTIMATION; ROUGHNESS MEASUREMENT; STANDARDS; TREES (MATHEMATICS); WAVELET TRANSFORMS;

TEXTURE CHARACTERIZATION METHODS;

SURFACE ROUGHNESS;

EID: 0034497518     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)63458-1     Document Type: Article

References (136)

1. Whitehouse, D.J., 1994, Handbook of surface metrology. Institute of Physics Publishing, Bristol and Philadelphia.
2. Thomas, T.R. (Ed.), 1982, Rough surfaces, Longmann Group Ltd., New York.
3. Thomas, T.R., 1999, Rough surfaces (second edition). Imperial College Press, London.
4. ISO 4287:1997 Geometrical product specifications (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters.
5. ISO 12085:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Motif parameters.
6. ISO 13565-1:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method; Surfaces having stratified functional properties - Part 1: Filtering and general measurement conditions.
7. ISO 13565-2:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method; Surfaces having stratified functional properties - Part 2: Height characterisation using the linear material ratio curve.
8. ISO 13565-3:1998 Geometrical Product Specifications (GPS) - Surface texture: Profile method; Surfaces having stratified functional properties - Part 3: Height characterisation using the material probability curve.
9. ISO 11562:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method Metrological characteristics of phase correct filters.
10. ISO 4288:1996 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture.
11. ISO 1302:2000 Geometrical Product Specifications (GPS) - Indication of surface texture in technical product documentation (in press).
12. Whitehouse, D.J., Vanherck, P., De Bruin, W., van Luttervelt, C.A., 1974, Assessment of surface topology analysis techniques in turning, Annals of the CIRP, 23/2:265-282.
13. Peters, J., Vanherck, P., Sastrodinoto, M., 1979, Assessment of surface topology analysis techniques, Annals of the CIRP, 28/2:539-554.
14. Whitehouse, D.J., 1988, Comparison between stylus and optical methods for measuring surfaces, Annals of the CIRP, 37/2:649-653.
15. Whitehouse, D.J., Bowen, O.K., Venkatesh, V.C., Lonardo, P., Brown, C.A., 1994, Gloss and surface topography, Annals of the CIRP, 43/2:541-549.
16. Lonardo, P.M., Trumpold, H., De Chiffre, L., 1996, Progress in 3D surface microtopography characterization, Annals of the CIRP, 45/2:589-598.
17. Malburg, M.C., Raja, J., 1993, Characterization of surface Texture Generated by Plateau Honing process, Annals of the CIRP 42/1: 637-639.
18. Strebaek Nielsen, H., 1988, New approaches to surface roughness evaluation of special surfaces, Prec. Eng., Vol. 10: 209-213.
19. De Chiffre. L., 1999, Industrial survey on ISO surface texture parameters, Annals of the CIRP, 48/3:74-77.
20. Stout, K. et al., 1993, The development of methods for the characterisation of roughness in three dimensions, Report EUR 15178 EN. EC Brussels.
21. Stout, K.J., 1994, Three Dimensional Surface Topography; Measurement, Interpretation and Applications, Penton Press, London.
22. De Chiffre, L., Christiansen, S., Skade, S., 1994, Advantages and industrial applications of three-dimensional surface roughness analysis, Annals of CIRP, 43/1:473-478.
23. Carneiro, K. et al, 1995, Roughness Parameters of Surfaces by Atomic Force Microscopy, Annals of the CIRP, 44/1:517-522.
24. Stout, K.J., Sullivan, P.J., Dong, W.P., Mainsah, E., 1991, Analysis of 3-D Surface Topography Questionnaire, Interim Report, The University of Birmingham.
25. Thomas, T.R., 1998, Trends in Surface Roughness, Int. J. of Machine Tools & Manufacture38:405-411.
26. Scott, P.J., 1994, Recent Advances In Areal Characterisation, Int. Surface Colloquium, TU Chemnitz-Zwickau:151-159.
27. Digital Instruments, 1996, NanoScope Command Reference Manual, Santa Barbara, USA.
28. Evans, C., Bryan J., 1999, "Structured", "Textured" or "Engineered" Surfaces, Annals of the CIRP, 48/2:541-556.
29. Srihari, S.N., 1981, Representation of Three-Dimensional Digital Images, ACM Computing Survey, 13:399-424.
30. Samet, H., 1984, The Quadtree and Related Hierarchical Data Structures, ACM Computing.
31. Ohlsson, R., 1996, A topographic study of functional surfaces, Ph.D. Thesis, Dep. of Production Engineering, Chalmers University of Technology, Göteborg, Sweden.
32. Christiansen, S., De Chiffre, L., 1996, Topographic investigation of wear resistance of PTFE seals in sliding contact with ceramic materials., Tribol. Trans.39:434-440
33. Staufert G., Matthias E., 1977, Kennwerte der Oberflächenrauhigkeit und ihre Aussagekraft hinsichtlich der Charakterisierung bestimmter Oberflächentypen, Annals of the CIRP, Vol. 25/1:345-350.
34. Staufert G, 1979, Characterisation of Random Roughness Profiles - A Comparison of AR-Modeling Technique and Profile Description by Means of Commonly Used Parameters, Annals of the CIRP, 28/1:431-435.
35. Peklenik J., 1969, Neue statistische Verfahren zur topographischen Erfassung von Oberflächen, wt-Z. Ind. Fertig., Vol. 59: 633-637.
36. Vorburger T.V., Teague E.C., 1981, Optical techniques for on-line measurement of surface topography, Prec. Eng., Vol. 3:61-83.
37. Bennett J.M., Mattsson L., 1999, Introduction to surface roughness and scattering, Optical Society of America, Washington D.C.
38. Stover J.C., 1995, Optical scattering : measurement and analysis, SPIE Optical Engineering Press, Bellingham, Washington.
39. Ogilvy J.A., 1991, Theory of Wave Scattering from Random Rough Surfaces, Hilger, Bristol.
40. Whitehouse D.J., 1993, Manufacture to Function In Optics, Annals of the CIRP, 42/1: 641-646.
41. Lonardo P.M., Bruzzone A.A., Gambaro C., 1991, Surface Characterization and Defect Detection by Analysis of Images Obtained with Coherent Light, Annals of the CIRP, 40/1:541-544.
42. Goch, G., Peters J., Lehmann P., Liu H., 1999, Requirements for the application of speckle correlation techniques to on-line inspection of surface roughness, Annals of the CIRP, Vol. 48/1:467-470.
43. Lehmann, P.: Untersuchungen zur Lichtstreuung an technischen Oberflächen im Hinblick auf eine prozessgekoppelte laseroptische Rauheitsmessung. Fortschrittberichte VDI, Reihe 8, Nr. 463, Düsseldorf 1995.
44. Peters, J.: Parametrisches laseroptisches Rauheitsmeßsystem aus der Sicht real auftretender Oberflächentopographien. Fortschrittberichte VDI, Reihe 8, Nr. 792, Düseldorf 1999.
45. Lehmann, P., Goch G., 2000, Comparison of Conventional Light Scattering and Speckle Techniques Concerning an In-process Characterisation of Engineered Surfaces, Annals of the CIRP, 49/1:419-422.
46. T. A. Germer, Multidetector hemisperical polarized optical scattering instrument, SPIE Proceedings Vol. 3784 (1999) pp. 304-313.
47. th International Conference on Optoelectronics, Optical Sensors & Measuring Techniques, pp. 139-144.
48. th International Symposium on Optical Science, Engineering and Instrumentation, San Diego, 30 July to 4 August 2000 (in print)
49. Brodmann, R.; Gast, Th.; Thurn, G.: An Optical Instrument for Measuring the Surface Roughness in Production Control. Annals of the CIRP Vol. 33/1/1984.
50. Mandelbrot B.B., Passoja D.E., Paullay A.J., 1984, Fractal character of fracture surfaces of metals, Nature, Vol. 38:721-722.
51. RUSS J.C., 1991, Measurement of the fractal dimension surfaces, Journal of Computer-Assisted Microscopy, Vol. 3:127-143.
52. Hall P., Davies S., 1995, On direction-invariance of fractal dimension on a surface, Applied Physics A: Materials Science & Processing, Vol. 60:271-274.
53. Thomas T.R., Rosén B.-G., Amini N., 1999, Fractal characterization of the anisotropy of rough surfaces, Wear, Vol. 232:41-50.
54. th Annual Meeting of The American Society for Precision Engineering, Monterey, ASPE, Raleigh, 355-359
55. Bukkapatnam S.T.S., Lakhtakia A., Kumara S.R.T., Satapathy G., 1995, Characterization of nonlinearity of cutting tool vibrations and chatter, American Society of Mechanical Engineers, Materials Division (Publication) MD ASME Materials Division Proceedings of the 1995 ASME International Mechanical Engineering Congress and Exposition. Part 2 (of 2) Nov 12-17 1995, Vol. 69.
56. Bukkapatnam S.T.S., Kumara S.R.T., Lakhtakia A., 1999. Local eigenfunctions based suboptimal wavelet packet representation of contaminated chaotic signals, IMA Journal of Applied Mathematics, Vol. 63:149-162.
57. Bukkapatnam S.T.S., Kumara S.R.T., Lakhtakia A., 2000. Fractal analysis of flank wear in machining, ASME Journal of Dynamic Systems, Measurement and Control, Vol.122:89-94.
58. RUSS J.C., 1994, Fractal Surfaces, Plenum Press, New York and London.
59. Hamblin M.G., Stachowiak G.W., 1994, Measurement of fractal surface profiles obtained from scanning electron and laser scanning microscope images and contact profile meter, Journal of Computer-Assisted Microscopy, Vol. 6:181-194.
60. Almqvist N., 1996, Fractal analysis of scanning probe microscopy images, Surface Science, Vol. 35:221-228.
61. Hasegawa M., Liu J., Okuda K., Nunobiki M., 1996, Calculation of the fractal dimensions of machined surface profiles, Wear, Vol. 192:40-45.
62. Charkaluk E., Bigerelle M., lost A., 1998, Fractals and fracture, Engineering Fracture Mechanics, Vol. 61:119-139.
63. Majumdar A., Bhushan B., 1990, Role of fractal geometry in roughness characterization and content mechanics of surfaces, ASME Journal of Tribology, Vol 112:205-216.
64. Ling F.F., 1987, Scaling law for contoured length of engineered surfaces, Journal of Applied Physics, Vol. 62:2570-2572.
65. Ling F.F., 1989, The possible role of fractal geometry in tribology, Tribology Transactions, Vol. 32:497-505.
66. Brown C.A., Savary G., 1991, Describing ground surface texture using contact profilometry and fractal analysis, Wear, Vol. 141:211-226.
67. Brown C.A., Charles P.D., Johnsen W.A., Chesters S., 1993, Fractal analysis of topographic data by the patchwork method, Wear, Vol. 161:61-67.
68. Thomas A., Thomas T.R., 1988, Digital analysis of very small scale surface roughness, J. Wave-Material Interaction, Vol. 3:31-350.
69. Majumdar A., Bhushan B., 1991, Fractal model of elastic-plastic contact between rough surfaces, Journal of Tribology, Vol. 113:1-11.
70. Mandelbrot B.B., 1977, Fractals: form, chance and dimension, WH Freeman, San Francisco.
71. Mandelbrot B.B., 1985, Self-affine fractals and fractal dimension, Physica Scripta, Vol. 32:257-260.
72. Tricot C., 1993, Courbes et dimension fractale, Springer-Verlag, Paris.
73. Alcock J., Sørensen O.T., Jensen S., Kjeldsteen P.,1996, Comparative wear mapping techniques II. Surface roughness and fractal dimension mapping of tungsten carbide/silicon carbide, Wear, Vol. 194:228-237.
74. Berry M.V., Lewis Z.V., 1980, On the WeierstrassMandelbrot fractal function, Proc. R. Soc. Lond, A., Vol. 370:459-484.
75. Sayles R.S., Thomas T.R., 1978, Surface topography as a non-stationary random process, Nature, Vol. 271:431-434.
76. Majumdar A., Tien C.L., 1990, Fractal characterization and simulation of rough surfaces, Wear. Vol. 136:313-327.
77. Zahouani H., Varglolu R., Loubet J.L., 1998, Fractal Models of Surface Topography and Contact Mechanics, Mathematical and Computer Modeling, Vol. 28:517-534.
78. Komvopoulos K., Van W., 1997, Fractal analysis of stiction in microelectromechanical systems, J. of Tribology: Transactions of the ASME, Vol 119:391-400.
79. Komvopoulos K., Van W., 1998, Three-dimensional elastic-plastic fractal analysis of surface adhesion in microelectromechanical systems, J. of Tribology: Transactions of the ASME, Vol 120:808-813.
80. Silk T., Hong Q., Tamm J., Compton R.G., 1998, AFM studies of polypyrrole film surface morphology. II. Roughness characterization by the fractal dimension analysis, Synthetic Metals, Vol. 93:65-71.
81. Doege E., Laackman B., Kischnick B., 1995, Fractal geometry used for the characterization of sheet surfaces, Annals of the CIRP, 44/1:197-200.
82. Sayles R.S., Thomas T.R., 1977, The spatial representation of surface roughness by means of the structure function: a practical alternative to correlation, Wear, Vol. 42:263-276.
83. Berry M.V., 1979, Diffractals. J. Physics, Vol. A12:781-797.
84. Rosen B.G., Ohlsson R., Thomas T.R., 1998, Nano metrology of cylinder bore wear, Int. J. of Machine Tools & Manufacture, Vol. 38:519-527.
85. Dubuc B., Quiniou J.F., Roques-Carmes C., Tricot C., W Zucker S., 1989, Evaluating the fractal dimension of profiles, Physical Review A, Vol. 39:1500-1512.
86. Tricot C., Quiniou J.F., Wehbi D., Roques-Carmes C., 1988, Evaluation de la dimension fractale d'un graphe, Revue Phys. Appl., Vol. 23:111-124.
87. Pimienta C., Dubuc B., Tawashi R., 1994, Surface fractal dimension and the quantification of roughness of titanium implant material, Cells and Materials, Vol. 4:379-386.
88. Amada S., Hirose T., 1998, Influence of grit-blasting pre-treatment on the adhesion strength of plasma sprayed coatings: Fractal analysis of roughness, Surface & Coatings Tech, Vol. 102:132-137.
89. Amada S., Satosh A., 2000, Fractal analysis of surfaces roughened by grit blasting, Journal of Adhesion Science and Technology, Vol. 14:27-41.
90. Brown C.A., Johnsen W.A., Butland R.M., 1996. Scale-sensitive fractal analysis of turned surfaces, Annals of the CIRP, 45/1:515-518.
91. Galante G., Lombarde A., Piacentini M., 1993, Fractal dimension: A useful tool to describe the microgeometry of machined surfaces, Int. Journal of Machined Tools & Manufacture, Vol. 33:525-530.
92. Terry A.J., Brown C.A., 1997, A comparison of topographic characterization parameters in grinding, Annals of the CIRP, 46;1:479-500.
93. Provder T., Kunz B., 1996, Application of profilometry and fractal analysis to the characterization of coatings surface roughness, Progress in Organic Coatings, Vol. 27:219-226.
94. Fahmy Y., Russ J.C., Koch C.C., 1991, Application of fractal geometry measurements to the evaluation of fracture toughness of brittle intermetallics, Journal of Materials Research, Vol. 6:1856-1861.
95. Kant R., 1996, Statistics of approximately self-affine fractals: random corrugated surface and time series, Physics Review, Vol. E53:5749-5763.
96. Pfeifer P., Avnir D., 1983, Chemistry in noninteger dimensions between two and three. I. Fractal theory of heterogenous surfaces, Journal of Chemical Physics, Vol. 79:3558-3563.
97. Ismail I.M.K., Pfeifer P., 1994, Fractal analysis and surface roughness of nonporous carbon fibers and carbon blacks, Langmuir, Vol. 10:1532-1538.
98. Sonwane C.G., Bhatia S.K., Carlos N.L., 1999, Characterization of surface roughness of MCM-41 using methods of fractal analysts, Langmuir, Vol. 15:4603-4612.
99. Lakshminarayanan V., Srinivasan R., Chu D., Gilman S., 1997, Area determination in fractal surfaces of R and Pt-Ru electrodes, Surface Science, Vol. 392:44-51.
100. Saffarian H.M., Srinivasan R., Chu D., Gilman S., 1998, Area determination in fractal surfaces of Pt and Pt-Ru catalysts for methanol oxidation, Electrochimica Acta, Vol. 44:1447-1454.
101. nd February of the year 2000, Edited by M Dietzsch, H Trumpold, Shaker Verlag, Aachen (2000).
102. (102] Brown C.A., Johnsen W.A., Huit K.M., 1998, Scalesensitivity, fractal analysis and simulations, International Journal of Machine Tools and Manufacturina. Vol. 38:633-637.
103. Goupillaud P., Grossmann A., Mortel J., 1984, Cycle-octave and Related Transforms in Seismic Signal Analysis, Geoexploration, Vol, 23:85-102.
104. Morlet J., 1972, Seismic Tomorrow: Interferometry and Quantum Mechanics, Presented at the 45th Annual International SEG Meeting, October 15, 1972.
105. Meyer Y., 1989, Orthonormal Wavelets, in Wavelets, Time-Frequency Methods and Phase Space (Lecture Notes on IPTI), J.M. Combes et al., Eds., Springer-Verlag, New York.
106. Grossmann A., Mortel J., 1984, Decomposition of Hardy Function into Square Integrable Wavelets of Constant Shape, SIAM. J. Math. Anal., Vol. 15 No.4:723-736.
107. Mallat S., 1989, Multifrequency Channel Decompositions of Images and Wavelet Models, IEEE Trans. Acoust., Speech, Signal Processing, Vol. 37:2091-2110.
108. Combes J.M. et al. (Eds.), 1989, Wavelets, Time-Frequency Methods, and Phase Space (lecture Notes on IPTI), Springer-Verlag, New York.
109. Strang G., 1989, Wavelets and Kilation Equations: A brief introduction, SIAM Rev., Vol. 31:614-627.
110. Chen, X., Raja J., Simanapalli S., 1995, Multi-scale. Analysis of Engineering Surfaces, International Journal of Machine tools and manufacture, Vol. 35 No. 2:231-238.
111. Liu X., Raja J., 1996, Analyzing Engineering Surface Texture using Wavelet Filter, Proceedings of SPIEWavelet Applications in Signal and Image processing, Vol. 2825:942-949.
112. Liu X., Raja J., SannaReddy H., 1996, Assessment of Plateau Honed Surface Texture using Wavelet transform, Proceeding of the ASPE Annual meeting, Vol. 14:672-675.
113. Jlang X.Q., Blunt L, Stout K.J., 1997, Evaluations of Functional features of orthopedic Joint Prostheses Surfaces using Wavelets, Proceedings of the ASPE spring Topical meeting, pp. 20-25.
114. Lee S.H., Zhouani H., Caterini R., Mathia T.G., 1997, Morphological Characterization of Engineered Surfaces by Wavelet Transform, Transaction of the 7th International Conference on Metrology: 182-190.
115. Raja J., 2000, Filtering of Surface profiles- Past, Present and Future, Precision Engineering, pp. 99-108, Narosa Publishing House.
116. ISO TC 213, AG9- Extraction techniques, committee correspondence, 1999.
117. Liu,X., 1999, Advanced Techniques for Separating Roughness, Waviness and Form, Ph.D Dissertation, UNC Charlotte, USA.
118. Simonsen, I., Hansen, A., Nes, O. M., 1998, Determination of the Hurst Exponent by use of Wavelet Transforms, Physical Review E, Vol. 58:2779-2787.
119. Dogariu, A., Uozumi, J., Asakura, T., 1994, Wavelet Transform Analysis of Slightly Rough Surfaces, Optics Communications, Vol. 107:1-5.
120. Chen, Q., Yang, S., Li, Z., 1999, Surface Roughness Evaluation by Using Wavelets Analysis, Precision Engineering, Vol. 23:209-212.
121. Jiang, X. Q., Blunt, L., Stout, K. J., 1999, Three-dimensional Surface Characterization for Orthopaedic Joint Prostheses, Proc. of the Institution of Mechanical Engineers Part H - Journal of Engineering in Medicine, Vol. 213:49-68.
122. Wang, Y., Moon, K. S., 1997, A Methodology for the Multi-resolution Simulation of Grinding Wheel Surface, Wear, Vol. 211:218-225.
123. International Vocabulary of Basic and General Terms in Metrology, 1993, ISO, Geneva.
124. Hajtiema, H., Morel, M., Traceable roughness measurements of products, Proceedings of the 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology, Vol 2, 373-381.
125. ISO 5436-1: 2000, Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards, Part 1: Material measures.
126. (126] EAL G20, 1996, Calibration of Stylus Instruments for Measuring Surface Roughness, Edition 1, 1-9.
127. SO/DIS 5436-2: 1999 Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards, Part 2: Software measurement standards.
128. Development of a basis for 3D surface roughness standards (SURFSTAND). European project reference: SMT 4982209. Project end: 2001
129. Kofod, N., Garnaes, J., Jørgensen, J.F., 2000, Calibrated line measurements with an Atomic Force Microscope, Proceedings of the 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology, Vol 2, 373-381.
130. th seminar on quantitative microscopy (QM 2000), Semmering, Austria, 36-43.
131. Bennich, P., 2000, Private communication from chairman of ISO TC213.
132. th Int. Conf. Metr. and Prop, of Eng. Surfaces, 244-251.
133. th IMEKO Symposium Metrology for quality Control in production, Vienna.
134. Gorlenko D.A., 1981, Assessment of surface roughness parameters and their independence, Precision Engineering 105-108.
135. Thomas T.R., 1981, Characterisation of surface roughness, Precision Engineering, 97-104.
136. De Chiffre, L., 1997, Rationalisation of surface parameters, CIRP STC "S" meeting, Paris, France, Technical note, Technical University of Denmark, IPT.