Analysis of titanium dental implants after failure of osseointegration: Combined histological, electron microscopy, and X-ray photoelectron spectroscopy approach

Journal of Biomedical Materials Research

Volumn 43, Issue 3, 1998, Pages 300-312

  Arys, A ^a   Philippart, C ^a   Dourov, N ^a   He, Y ^b   Le, Q T ^b   Pireaux, J J ^b  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Dental implant; Osseointegration failure; Surface analysis; Titanium

Indexed keywords

DIFFUSION IN SOLIDS; DISSOCIATION; DISSOLUTION; ELECTRON MICROSCOPY; FAILURE ANALYSIS; OPTICAL MICROSCOPY; PROTECTIVE COATINGS; REDUCTION; SURFACE PROPERTIES; TITANIUM; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON MICROPROBE ANALYSIS; HISTOLOGY; OSSEOINTEGRATION;

DENTAL PROSTHESES;

TITANIUM;

ARTICLE; CHEMICAL COMPOSITION; ELECTRON MICROSCOPY; FIBROSIS; IMPLANT; MICROANALYSIS; TOOTH IMPLANTATION; X RAY ANALYSIS;

CONNECTIVE TISSUE; DENTAL IMPLANTS; ELECTRON PROBE MICROANALYSIS; HUMANS; MICROSCOPY, ELECTRON, SCANNING; OSSEOINTEGRATION; REFERENCE STANDARDS; TITANIUM;

EID: 0032171419     PISSN: 00219304     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4636(199823)43:3<300::AID-JBM11>3.0.CO;2-J     Document Type: Article

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